Mitutoyo LCD Plan Apo NIR 20x Objective (NA 0.40, WD 20mm, 480–1800nm, M26)

In stock

SKU: 378-827-16

Regular price $3,300.00
The Mitutoyo LCD Plan Apo NIR 20× Objective is a specialized near-infrared and SWIR optimized plan apochromat objective from Mitutoyo’s LCD Plan Apo NIR series — delivering 20× magnification with a 20mm working distance, 480–1800nm spectral range, and optical correction specifically designed for imaging through a protective cover glass or flat panel substrate. The LCD designation distinguishes this objective from the standard M Plan Apo NIR series: it is corrected for use with specimens viewed through a cover glass or protective glass layer, making it the correct choice for LCD panel inspection, encapsulated specimens, and any NIR/SWIR application where a glass layer lies between the objective and the specimen.

KEY FEATURES

  • LCD / cover glass corrected — the defining feature of the LCD Plan Apo NIR series; optically corrected for imaging through a protective cover glass or flat panel substrate, eliminating the spherical aberration that standard (non-cover-glass-corrected) objectives introduce when imaging through glass layers
  • NIR/SWIR spectral range: 480–1800nm — transmission extending to 1800nm enables LCD panel inspection at NIR wavelengths, InGaAs camera imaging, SWIR fluorescence, and Raman spectroscopy with long-wavelength excitation lasers
  • Long working distance: 20mm — exceptional clearance for a 20× objective, providing ample room for large panel specimens, environmental chambers, and inspection fixtures
  • NA 0.40 at 20× — practical numerical aperture for a long working distance NIR/SWIR objective, delivering good resolution for panel inspection, defect detection, and wide-area NIR/SWIR survey
  • Plan apochromat correction — Mitutoyo’s highest level of chromatic and spherical aberration correction for accurate, flat-field imaging across the full 480–1800nm spectral range
  • Infinity-corrected, M26 thread — compatible with Mitutoyo FS series microscopes and other infinity-corrected systems with M26 nosepieces
  • 🇯🇵 Mitutoyo quality, made in Japan — precision optical construction for consistent, high-efficiency NIR/SWIR transmission and long service life
  • Catalog number 378-827-16
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Product Overview

The Mitutoyo LCD Plan Apo NIR 20× (378-827-16) is a specialized objective combining NIR/SWIR optimization with cover glass correction — a combination that addresses a specific and common challenge in flat panel display inspection and encapsulated specimen imaging. Standard long working distance objectives (including the M Plan Apo NIR series) are designed for imaging uncovered specimens; when a glass cover layer is present, it introduces spherical aberration that degrades image quality. The LCD Plan Apo NIR series is specifically corrected for this glass layer, delivering optimal optical performance when imaging through a protective cover glass or flat panel substrate. The 480–1800nm spectral range enables NIR and SWIR imaging through the cover glass, including LCD panel inspection at NIR wavelengths where certain panel defects and structures are more clearly revealed, InGaAs camera imaging, and Raman spectroscopy with NIR/SWIR excitation lasers. The 20mm working distance provides practical clearance for large panel specimens and inspection fixtures. For uncovered specimens requiring NIR/SWIR imaging at 20×, see the M Plan Apo NIR 20× (378-824-16). Compatible with Mitutoyo FS series microscopes and other infinity-corrected systems with M26 thread nosepieces. Catalog number 378-827-16.

Technical Specifications

Catalog Number 378-827-16
Magnification 20×
Numerical Aperture (NA) 0.40
Immersion Medium Dry (air)
Working Distance 20mm (Long Working Distance)
Spectral Range 480–1800nm (NIR + SWIR)
Cover Glass Correction Yes — LCD / cover glass corrected
Optical Design LCD Plan Apo NIR (Plan Apochromat, cover glass corrected, NIR/SWIR)
Correction Infinity-corrected (brightfield)
Thread / Mount M26
Compatible Systems Mitutoyo FS series; other infinity-corrected M26 systems
Country of Origin Japan
SKU 378-827-16

Microscope Compatibility

Typical Applications

LCD and flat panel display inspection at NIR/SWIR wavelengths through protective glass substrates
NIR/SWIR imaging of encapsulated or cover-glass-protected specimens at 20×
InGaAs camera imaging through cover glass requiring SWIR transmission to 1800nm
Raman spectroscopy through cover glass with NIR/SWIR excitation lasers
Silicon wafer inspection through protective glass layers at NIR wavelengths
Any NIR/SWIR application at 20× where a glass cover layer is present between objective and specimen
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