Mitutoyo M Plan Apo 100x Objective (NA 0.70, WD 6mm, Infinity, M26)
Regular price
$3,995.00
The Mitutoyo M Plan Apo 100× Objective is a premium plan apochromat objective from Mitutoyo’s M Plan Apo series — delivering high-magnification 100× imaging with an exceptional 6mm working distance and plan apochromat correction optimized for visible light. With 6mm of working clearance at 100× — 30–60× greater than standard 100× objectives — this objective enables high-magnification inspection of specimens in fixtures, chambers, and environments where standard objectives cannot reach.
KEY FEATURES
- Long working distance: 6mm — extraordinary clearance for a 100× objective (standard 100× objectives offer 0.1–0.2mm WD), providing 30–60× more clearance for specimens in environmental chambers, cryostats, vacuum systems, industrial fixtures, and laser processing setups where standard objectives are physically incompatible
- NA 0.70, 0.7µm resolving power — high numerical aperture for a long working distance objective, delivering sub-micron resolution for detailed semiconductor inspection, surface analysis, and high-magnification industrial imaging
- Plan apochromat (M Plan Apo) correction — Mitutoyo’s highest level of chromatic and spherical aberration correction for accurate, flat-field imaging across the full visible spectrum at 100×
- Visible light optimized — the standard visible-light version of the M Plan Apo 100×; for NIR/SWIR applications (silicon wafer through-inspection, Raman spectroscopy, NIR laser), see the M Plan Apo NIR 100× (378-826-15)
- Infinity-corrected, M26 thread — compatible with Mitutoyo FS series microscopes and other infinity-corrected systems with M26 nosepieces
- 🇯🇵 Mitutoyo quality, made in Japan — precision optical construction for consistent, high-efficiency visible light transmission and long service life
- Catalog number 378-806-3
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Technical Specifications
| Catalog Number | 378-806-3 |
| Magnification | 100× |
| Numerical Aperture (NA) | 0.70 |
| Immersion Medium | Dry (air) |
| Working Distance | 6mm (Long Working Distance) |
| Spectral Range | Visible light |
| Resolving Power | 0.7µm |
| Focal Depth | 0.6µm |
| Focal Length | 2mm |
| Field of View (Ø24 eyepiece) | Ø0.24mm |
| Real FOV (1/2" chip camera) | 0.05 × 0.06mm |
| Optical Design | M Plan Apo (Plan Apochromat, visible light) |
| Correction | Infinity-corrected (brightfield) |
| Thread / Mount | M26 |
| Compatible Systems | Mitutoyo FS series; other infinity-corrected M26 systems |
| Country of Origin | Japan |
| SKU | 378-806-3 |
Microscope Compatibility
Typical Applications
High-magnification semiconductor and IC surface inspection at 100× in visible light
Defect analysis and documentation on polished surfaces, thin films, and coatings
High-magnification imaging in environmental chambers, cryostats, or vacuum systems
Inspection of specimens in industrial fixtures or assemblies requiring 6mm clearance
Laser processing and micro-machining requiring simultaneous visible-light imaging at 100×
Any application requiring 100× magnification where standard working distance is insufficient
