Mitutoyo M Plan Apo NIR 100x Objective (NA 0.70, WD 6.0mm, Infinity, M26)
Regular price
$6,050.00
The Mitutoyo M Plan Apo NIR 100× Objective is a near-infrared optimized plan apochromat objective from Mitutoyo’s M Plan Apo NIR series — delivering high-magnification 100× imaging with an exceptional 6.0mm working distance and optimized transmission across the visible and near-infrared spectrum (400–1000nm+). The definitive choice for high-resolution NIR imaging, Raman spectroscopy mapping, silicon wafer inspection, and NIR laser processing applications where standard visible-optimized objectives have insufficient NIR transmission.
KEY FEATURES
- NIR-optimized transmission (400–1000nm+) — optical glass and coatings selected for high transmission across the near-infrared spectrum, enabling silicon wafer inspection (silicon is transparent at NIR wavelengths), Raman spectroscopy with NIR excitation lasers (785nm, 830nm, 1064nm), NIR laser delivery, and any high-resolution NIR imaging application where standard objectives are opaque or poorly transmitting
- Long working distance: 6.0mm — extraordinary clearance for a 100× objective (standard 100× objectives offer 0.1–0.2mm WD), providing 30–60× more clearance for specimens in environmental chambers, cryostats, vacuum systems, and laser processing setups, as well as ample room for beam delivery optics
- Plan apochromat (M Plan Apo) correction — Mitutoyo’s highest level of chromatic and spherical aberration correction for accurate, flat-field imaging across the full visible and NIR spectrum at 100×
- NA 0.70 at 100× — practical numerical aperture for a long working distance NIR objective, delivering good resolution for high-magnification semiconductor inspection, Raman mapping, and NIR laser applications
- Infinity-corrected, M26 thread — compatible with Mitutoyo FS series microscopes and other infinity-corrected systems with M26 nosepieces
- 🇯🇵 Mitutoyo quality, made in Japan — precision optical construction for consistent, high-efficiency NIR and visible light transmission and long service life
- Catalog number 378-826-15
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Technical Specifications
| Catalog Number | 378-826-15 |
| Magnification | 100× |
| Numerical Aperture (NA) | 0.70 |
| Immersion Medium | Dry (air) |
| Working Distance | 6.0mm (Long Working Distance) |
| Spectral Range | 400–1000nm+ (NIR-optimized) |
| Optical Design | M Plan Apo NIR (Plan Apochromat, NIR-optimized) |
| Correction | Infinity-corrected |
| Thread / Mount | M26 |
| Compatible Systems | Mitutoyo FS series; other infinity-corrected M26 systems |
| Country of Origin | Japan |
| SKU | 378-826-15 |
Microscope Compatibility
Typical Applications
Silicon wafer and IC backside/through-silicon inspection at 100× using NIR transparency
High-spatial-resolution Raman spectroscopy mapping with NIR excitation (785nm, 830nm, 1064nm)
NIR laser processing, delivery, and beam characterization at high magnification
Subsurface defect detection in silicon and other NIR-transparent materials
High-magnification NIR imaging in environmental chambers, cryostats, or vacuum systems
Any high-resolution NIR imaging or spectroscopy application requiring 100× magnification
