Olympus LMPLANFL N 20X Long Working Distance Objective
SKU: OLYMPUS-LMPLFLN-20X
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Premium 20× long working distance objective — ideal for industrial inspection with generous clearance.
- 🔬 20× Magnification, NA 0.4 — High resolution for detailed imaging and analysis.
- 📏 Long Working Distance (12 mm) — Generous clearance for thick specimens and manipulation.
- 🧠 LMPLANFL Plan Semi-Apochromat Design — Delivers flat-field imaging with excellent color correction.
- ⚙️ RMS Thread Mount — Standard threaded mount for broad microscope compatibility.
- ✨ Condition: Excellent, flawless optics — High-quality optics with full performance specifications.
🔧 Product Description
The Olympus LMPLANFL N 20× Long Working Distance Objective is a high-performance objective engineered for industrial microscopy applications requiring both detailed imaging and generous working distance. As part of Olympus's Plan semi-apochromat series, this objective combines 20× magnification with a 12 mm working distance, making it an essential tool for materials analysis, quality control, and applications requiring specimen manipulation during observation.
The 12 mm working distance provides generous clearance for thick specimens, rough surfaces, or samples that require manipulation during observation. This extended working distance also reduces the risk of objective damage from contact with the specimen, protecting your investment in precision optics while enabling confident inspection of challenging samples.
At 20× magnification with a numerical aperture of 0.4, this objective delivers high resolution for detailed examination of industrial specimens. The LMPLANFL optical design ensures flat-field imaging with minimal distortion from center to edge, while the plan semi-apochromat correction delivers excellent color fidelity and chromatic aberration control.
Compatible with microscopes via standard RMS thread mount, this objective integrates seamlessly into metallurgical, materials science, and industrial microscopy workflows.
🔎 Typical Applications
- Metallurgical analysis and microstructure examination
- Inspection of thick specimens and rough surfaces
- Quality control and failure analysis
- Materials science research and characterization
- Industrial reflected light microscopy
📊 Key Specifications
Specification |
Details |
Magnification |
20× |
Numerical Aperture (NA) |
0.4 |
Optical Design |
LMPLANFL (Plan Semi-Apochromat) |
Working Distance |
12 mm (Long) |
Mount |
RMS Thread |
Application |
Industrial Reflected Light Microscopy |
SKU |
OLYMPUS-LMPLFLN-20X |
Condition |
Excellent, flawless optics |
💼 University Purchase Orders Accepted
Thank you for viewing! Please contact us with any questions about this objective or your specific industrial microscopy requirements.
