{"product_id":"zeiss-epiplan-neofluar-100x-brightfield-darkfield-dic-objective","title":"Zeiss Epiplan-Neofluar 100x Brightfield Darkfield DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 100X BD DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 100X magnification with 0.90 numerical aperture for exceptional resolution\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e\n📏 0.32mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 100X BD DIC is a premium multi-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring multiple observation techniques and exceptional optical quality at high magnification. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a high 100X magnification and exceptional 0.90 numerical aperture, this objective provides outstanding resolution for detailed examination of fine surface features, while the 0.32mm working distance accommodates standard specimens. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of DIC prisms and other optical accessories. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance at high magnification.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eFine surface feature analysis at high magnification\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 100X BD DIC \/ 442385\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.90\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e0.32mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695646409005,"sku":"442385","price":1100.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442385-2.jpg?v=1765533336","url":"https:\/\/www.spachoptics.com\/products\/zeiss-epiplan-neofluar-100x-brightfield-darkfield-dic-objective","provider":"Spach Optics, Inc.","version":"1.0","type":"link"}