{"product_id":"olympus-lmplanfl-100x-brightfield-darkfield-objective","title":"Olympus LMPLANFL 100x\/0.80 Brightfield \u0026 Darkfield Long Working Distance Objective (NA 0.80, Infinity, M26)","description":"\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif; color: rgb(0,0,0);\"\u003eThe \u003cstrong\u003eOlympus LMPLANFL 100×\/0.80 Brightfield \u0026amp; Darkfield Long Working Distance Objective\u003c\/strong\u003e is a specialized reflected light objective from Olympus’s LMPLANFL series — delivering an exceptional 3.3mm working distance at 100× with dual brightfield and darkfield capability for coverslip-free inspection of opaque specimens including metals, semiconductors, ceramics, and polished surfaces. Offered here in excellent condition with flawless optics at significant savings versus the new list price.\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif; color: rgb(0,0,0);\"\u003e \n\u003cli\u003e📏 \u003cstrong\u003eLong working distance: 3.3mm\u003c\/strong\u003e — exceptional clearance at 100× for imaging large, thick, or mounted specimens that standard 100× objectives cannot accommodate; standard 100× reflected light objectives typically offer 0.1–1.0mm of working distance\u003c\/li\u003e\n\u003cli\u003e🔦 \u003cstrong\u003eDual brightfield \u0026amp; darkfield capability\u003c\/strong\u003e — a single objective supports both brightfield and darkfield reflected light imaging, enabling high-contrast surface defect detection and grain boundary visualization without changing objectives\u003c\/li\u003e\n\u003cli\u003e🔬 \u003cstrong\u003eNA 0.80 at 100×\u003c\/strong\u003e — high numerical aperture for excellent resolution and contrast in reflected light imaging of opaque specimens\u003c\/li\u003e\n\u003cli\u003e🪨 \u003cstrong\u003eCoverslip-free design\u003c\/strong\u003e — designed for direct specimen contact imaging without a coverslip, as required for metallographic and semiconductor inspection of polished surfaces\u003c\/li\u003e\n\u003cli\u003e♾️ \u003cstrong\u003eInfinity-corrected, M26 thread\u003c\/strong\u003e — compatible with Olympus BX, GX, MX, and BHM series industrial and materials microscopes\u003c\/li\u003e\n\u003cli\u003e🇯🇵 \u003cstrong\u003eOlympus quality, made in Japan\u003c\/strong\u003e — precision optical construction for consistent, high-efficiency light transmission and long service life\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eCondition: Excellent — flawless optics\u003c\/strong\u003e — SKU 1-UN354\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif; color: rgb(0,0,0);\"\u003eThe Olympus LMPLANFL 100×\/0.80 is a purpose-built long working distance reflected light objective for industrial and materials science applications where both extended working clearance and darkfield capability are required at 100×. The 3.3mm working distance is exceptional for a 100× reflected light objective — standard 100× reflected light objectives typically offer 0.1–1.0mm of working distance, making them impractical for large wafers, thick substrates, mounted specimens, or components in fixtures. The LMPLANFL design provides both brightfield and darkfield reflected light capability from a single objective — brightfield for standard surface imaging and darkfield for high-contrast detection of surface defects, scratches, particles, and grain boundaries that are difficult to see in brightfield. The coverslip-free design is appropriate for direct inspection of polished metallographic specimens, semiconductor wafers, and other opaque surfaces where coverslip use is impractical. Compatible with Olympus BX, GX, MX, and BHM series industrial and materials microscopes with M26 thread nosepieces. This unit is offered in excellent condition with flawless optics at a significant discount to the new list price of $6,800. SKU 1-UN354.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif; color: rgb(0,0,0);\"\u003e \n\u003cli\u003eMetallographic examination requiring both brightfield and darkfield at 100×\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer and die inspection with extended working clearance\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and grain boundary visualization using darkfield\u003c\/li\u003e\n\u003cli\u003eInspection of large, thick, or mounted specimens that standard 100× objectives cannot reach\u003c\/li\u003e\n\u003cli\u003eCeramics, glass, and advanced materials surface inspection\u003c\/li\u003e\n\u003cli\u003eAny application requiring long working distance and darkfield capability at 100×\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable style=\"width:100%; border-collapse: collapse; font-family: 'Segoe UI Emoji', sans-serif; color: rgb(0,0,0);\"\u003e\n\u003ctr style=\"background-color: #f2f2f2;\"\u003e\n\u003cth style=\"text-align:left; padding: 6px; border: 1px solid #ddd;\"\u003eSpecification\u003c\/th\u003e\n\u003cth style=\"text-align:left; padding: 6px; border: 1px solid #ddd;\"\u003eDetails\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eSKU\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003e1-UN354\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003e100×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003e0.80\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eImmersion Medium\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eDry (air, no coverslip)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003e3.3mm (LWD)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eIllumination \/ Contrast\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eBrightfield \u0026amp; Darkfield reflected light\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eCoverslip\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eNone (coverslip-free design)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eLMPLANFL (Long WD, Plan, Fluorite)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eThread \/ Mount\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eM26\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eCompatible Microscopes\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eOlympus BX, GX, MX, BHM series industrial\/materials microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eCountry of Origin\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eJapan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"padding: 6px; border: 1px solid #ddd;\"\u003eExcellent — flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif; color: rgb(0,0,0);\"\u003e\u003cem\u003eUniversity and institutional purchase orders are welcome. Please contact us for invoicing and procurement documentation.\u003c\/em\u003e\u003c\/p\u003e","brand":"Spach Optics, Inc.","offers":[{"title":"Default Title","offer_id":51695409758509,"sku":"1-UN354","price":3300.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/OLYMPUS-LMPLFL100XBD-2.jpg?v=1765522449","url":"https:\/\/www.spachoptics.com\/products\/olympus-lmplanfl-100x-brightfield-darkfield-objective","provider":"Spach Optics, Inc.","version":"1.0","type":"link"}