{"title":"Industrial Reflected Light O- Leica","description":"","products":[{"product_id":"zeiss-objective-ec-epiplan-neofluar-5x-bd-dic-m27","title":"Zeiss Objective EC Epiplan-Neofluar 5x BD DIC M27","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss EC Epiplan-Neofluar 5X BD DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance EC Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 5X magnification with 0.13 numerical aperture for versatile imaging\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield (B), Darkfield (D), and DIC compatible\u003cbr\u003e\n📏 Extra-long 14.5mm working distance ideal for thick specimens and manipulation\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss EC Epiplan-Neofluar 5X BD DIC is a versatile multi-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring multiple observation techniques. As part of Zeiss's renowned EC (Extended Contrast) Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard achromat objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a 5X magnification, this objective provides a wide field of view suitable for specimen overview, defect screening, and detailed examination, while the exceptionally long 14.5mm working distance provides ample clearance for thick specimens, wafers, samples requiring manipulation, and the insertion of DIC prisms or other optical accessories. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of optical accessories without compromising image quality. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance for laboratories and quality control facilities using Zeiss Axio reflected light microscopes.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eGeological and mineralogical sample examination\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss EC Epiplan-Neofluar 5X BD DIC \/ 1156-514\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e5X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.13\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEC Epiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield (B), Darkfield (D), DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e14.5mm (extra-long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695603188013,"sku":"1156-514","price":1195.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-1156-514-2.jpg?v=1765531147"},{"product_id":"zeiss-ec-epiplan-neofluar-100x-bd-dic-objective","title":"Zeiss EC Epiplan Neofluar 100X BD DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss EC Epiplan-Neofluar 100X BD DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 Premium EC Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 100X magnification with 0.90 numerical aperture for exceptional resolution\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e\n📏 0.28mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss EC Epiplan-Neofluar 100X BD DIC is a premium multi-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring multiple observation techniques and superior optical quality at high magnification. As part of Zeiss's EC (Extended Contrast) Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a high 100X magnification and exceptional 0.90 numerical aperture, this objective provides outstanding resolution for detailed examination of fine surface features, while the 0.28mm working distance accommodates standard specimens. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of DIC prisms and other optical accessories. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance at high magnification.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eFine surface feature analysis at high magnification\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss EC Epiplan-Neofluar 100X BD DIC \/ 422392\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.90\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEC Epiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e0.28mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695620882733,"sku":"ZEISS-422392","price":1800.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-422392-2.gif?v=1765531858"},{"product_id":"zeiss-ld-ec-epiplan-neofluar-20x-bd-dic-objective","title":"Zeiss LD EC Epiplan Neofluar 20X BD DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD EC Epiplan-Neofluar 20X BD DIC Long Working Distance Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 Premium LD EC Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 20X magnification with 0.22 numerical aperture for wide-field imaging\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e\n📏 Ultra-long 12mm working distance ideal for thick specimens and manipulation\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ New condition\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD EC Epiplan-Neofluar 20X BD DIC is a premium long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring exceptional working distance, multiple observation techniques, and superior optical quality at mid-magnification. As part of Zeiss's LD EC (Long Distance Extended Contrast) Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability and an ultra-long 12mm working distance—among the longest available for 20X magnification. The Neofluar optical formula provides enhanced chromatic correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a 20X magnification and 0.22 numerical aperture, this objective provides good resolution while maintaining a useful field of view, and the exceptional 12mm working distance provides unprecedented clearance for thick specimens, wafers, samples requiring extensive manipulation, measurement tools, probes, and the insertion of DIC prisms or other optical accessories. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes. This objective is in new condition, offering professional-grade multi-contrast performance with maximum working distance at 20X magnification.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection with probe access\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis with measurement tools\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eThick specimen imaging requiring maximum working distance\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD EC Epiplan-Neofluar 20X BD DIC \/ 422452-9960\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e20X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.22\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD EC Epiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e12mm (ultra-long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eNew\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695621046573,"sku":"422452-9960","price":4339.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-422452-9960-2.gif?v=1765531874"},{"product_id":"zeiss-ld-ec-epiplan-neofluar-50x-bd-dic-objective","title":"Zeiss LD EC Epiplan Neofluar 50X BD DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD EC Epiplan-Neofluar 50X BD DIC Long Working Distance Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔬 Premium LD EC Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e🎯 50X magnification with 0.55 numerical aperture for high-resolution imaging\u003cbr\u003e🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e🔆 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e📏 Ultra-long 9mm working distance ideal for thick specimens and manipulation\u003cbr\u003e🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e✨ Excellent condition with Flawless Optics\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe Zeiss LD EC Epiplan-Neofluar 50X BD DIC is a premium long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring exceptional working distance, multiple observation techniques, and superior optical quality. As part of Zeiss's LD EC (Long Distance Extended Contrast) Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability and an ultra-long 9mm working distance—among the longest available for 50X magnification. The Neofluar optical formula provides enhanced chromatic correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a 50X magnification and 0.55 numerical aperture, this objective provides excellent resolution for detailed examination, while the exceptional 9mm working distance provides unprecedented clearance for thick specimens, wafers, samples requiring extensive manipulation, measurement tools, probes, and the insertion of DIC prisms or other optical accessories. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes. This objective is in new\/open box condition, offering professional-grade multi-contrast performance with maximum working distance.\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection with probe access\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis with measurement tools\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eThick specimen imaging requiring maximum working distance\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD EC Epiplan-Neofluar 50X BD DIC \/ 422472\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e50X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.55\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD EC Epiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e9mm (ultra-long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695621341485,"sku":"422472","price":3500.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-422472-2.gif?v=1765531890"},{"product_id":"zeiss-ld-c-epiplan-apochromat-100x-dic-objective","title":"Zeiss LD C Epiplan Apochromat 100X DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD C Epiplan Apochromat 100X DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 Ultra-premium LD C Epiplan Apochromat objective for reflected light microscopy\u003cbr\u003e\n🎯 100X magnification with 0.75 numerical aperture for exceptional resolution\u003cbr\u003e\n🌈 Apochromatic correction delivers superior color fidelity across the spectrum\u003cbr\u003e\n🔬 Optimized for 405 nm wavelength for specialized imaging applications\u003cbr\u003e\n📏 Long 4.0mm working distance ideal for thick specimens and manipulation\u003cbr\u003e\n🔆 DIC compatible for enhanced contrast imaging\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ New \/ open box condition\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD C Epiplan Apochromat 100X DIC represents the pinnacle of reflected light objective design, combining apochromatic correction, long working distance, and specialized wavelength optimization for the most demanding industrial and research applications at high magnification. As part of Zeiss's premium LD C (Long Distance Corrected) Epiplan Apochromat series, this objective delivers exceptional chromatic correction across an extended wavelength range, ensuring accurate color reproduction and minimal chromatic aberration when examining reflective specimens. The apochromatic optical design provides superior color fidelity compared to fluorite or achromat objectives, making it ideal for applications requiring precise color analysis and multi-wavelength imaging. Optimized specifically for 405 nm wavelength, this objective is particularly well-suited for confocal microscopy, laser scanning applications, and specialized imaging techniques utilizing violet laser excitation. With a high 100X magnification and 0.75 numerical aperture, this objective provides outstanding resolution, while the long 4.0mm working distance provides ample clearance for thick specimens, wafers, samples requiring manipulation, and the insertion of DIC prisms or other optical accessories. The DIC compatibility enables Differential Interference Contrast imaging for enhanced visualization of surface topography and fine structural details. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes. This objective is in new\/open box condition, offering top-tier performance for laboratories requiring the highest optical quality at high magnification with extended working distance.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eConfocal microscopy with 405 nm laser excitation\u003c\/li\u003e\n\u003cli\u003eLaser scanning microscopy and specialized imaging\u003c\/li\u003e\n\u003cli\u003eMetallurgical analysis requiring apochromatic correction\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection with DIC\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eMulti-wavelength imaging and color analysis\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eHigh-magnification imaging requiring long working distance\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD C Epiplan Apochromat 100X DIC \/ 422492-9801\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.75\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD C Epiplan Apochromat, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eChromatic Correction\u003c\/td\u003e\n\u003ctd\u003eApochromat (superior color correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWavelength Optimization\u003c\/td\u003e\n\u003ctd\u003e405 nm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eDIC (Differential Interference Contrast) compatible\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e4.0mm (long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eConfocal, laser scanning, metallurgy, semiconductor inspection, DIC imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eNew \/ open box\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695621472557,"sku":"422492-9801","price":3995.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-422492-9801-2.gif?v=1765531906"},{"product_id":"zeiss-ld-ec-epiplan-neofluar-100x-bd-dic-objective","title":"Zeiss LD EC Epiplan Neofluar 100X BD DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD EC Epiplan-Neofluar 100X BD DIC Long Working Distance Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 Premium LD EC Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 100X magnification with 0.75 numerical aperture for exceptional resolution\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e\n📏 Extra-long 4.1mm working distance ideal for thick specimens and manipulation\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ New condition\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD EC Epiplan-Neofluar 100X BD DIC is a premium long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring exceptional working distance, multiple observation techniques, and superior optical quality at high magnification. As part of Zeiss's LD EC (Long Distance Extended Contrast) Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability and an extra-long 4.1mm working distance—among the longest available for 100X magnification. The Neofluar optical formula provides enhanced chromatic correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a high numerical aperture of 0.75, this objective provides outstanding resolution for detailed examination, while the exceptional 4.1mm working distance provides ample clearance for thick specimens, wafers, samples requiring manipulation, measurement tools, probes, and the insertion of DIC prisms or other optical accessories. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes. This objective is in new condition, offering professional-grade multi-contrast performance with maximum working distance at 100X magnification.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection with probe access\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis with measurement tools\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eHigh-magnification imaging requiring long working distance\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD EC Epiplan-Neofluar 100X BD DIC \/ 422492-9960\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.75\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD EC Epiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e4.1mm (extra-long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eNew\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695621570861,"sku":"422492-9960","price":6495.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-422492-9960-2.gif?v=1765531923"},{"product_id":"zeiss-ld-c-epiplan-apochromat-50x-dic-objective","title":"Zeiss LD C Epiplan Apochromat 50X DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD C Epiplan Apochromat 50X DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 Ultra-premium LD C Epiplan Apochromat objective for reflected light microscopy\u003cbr\u003e\n🎯 50X magnification with 0.60 numerical aperture for exceptional resolution\u003cbr\u003e\n🌈 Apochromatic correction delivers superior color fidelity across the spectrum\u003cbr\u003e\n🔬 Optimized for 405 nm wavelength for specialized imaging applications\u003cbr\u003e\n📏 Extra-long 7.6mm working distance ideal for thick specimens and manipulation\u003cbr\u003e\n🔆 DIC compatible for enhanced contrast imaging\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ New \/ open box condition\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD C Epiplan Apochromat 50X DIC represents the pinnacle of reflected light objective design, combining apochromatic correction, long working distance, and specialized wavelength optimization for the most demanding industrial and research applications. As part of Zeiss's premium LD C (Long Distance Corrected) Epiplan Apochromat series, this objective delivers exceptional chromatic correction across an extended wavelength range, ensuring accurate color reproduction and minimal chromatic aberration when examining reflective specimens. The apochromatic optical design provides superior color fidelity compared to fluorite or achromat objectives, making it ideal for applications requiring precise color analysis and multi-wavelength imaging. Optimized specifically for 405 nm wavelength, this objective is particularly well-suited for confocal microscopy, laser scanning applications, and specialized imaging techniques utilizing violet laser excitation. With a high 50X magnification and 0.60 numerical aperture, this objective provides outstanding resolution, while the exceptionally long 7.6mm working distance provides ample clearance for thick specimens, wafers, samples requiring manipulation, and the insertion of DIC prisms or other optical accessories. The DIC compatibility enables Differential Interference Contrast imaging for enhanced visualization of surface topography and fine structural details. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes. This objective is in new\/open box condition, offering top-tier performance for laboratories requiring the highest optical quality.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eConfocal microscopy with 405 nm laser excitation\u003c\/li\u003e\n\u003cli\u003eLaser scanning microscopy and specialized imaging\u003c\/li\u003e\n\u003cli\u003eMetallurgical analysis requiring apochromatic correction\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection with DIC\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eMulti-wavelength imaging and color analysis\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eThick specimen imaging requiring long working distance\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD C Epiplan Apochromat 50X DIC \/ 422672-9800\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e50X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.60\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD C Epiplan Apochromat, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eChromatic Correction\u003c\/td\u003e\n\u003ctd\u003eApochromat (superior color correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWavelength Optimization\u003c\/td\u003e\n\u003ctd\u003e405 nm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eDIC (Differential Interference Contrast) compatible\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e7.6mm (extra-long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eConfocal, laser scanning, metallurgy, semiconductor inspection, DIC imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eNew \/ open box\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695621931309,"sku":"422672-9800","price":4900.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-422672-9800-2.gif?v=1765531939"},{"product_id":"zeiss-ec-epiplan-apochromat-100x-hd-dic-objective","title":"Zeiss EC Epiplan Apochromat 100X HD DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss EC Epiplan Apochromat 100X HD DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 Ultra-premium EC Epiplan Apochromat objective for reflected light microscopy\u003cbr\u003e\n🎯 100X magnification with 0.95 numerical aperture for maximum resolution\u003cbr\u003e\n🌈 Apochromatic correction delivers superior color fidelity across the spectrum\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield (HD), and DIC compatible\u003cbr\u003e\n📏 0.21mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ New \/ open box condition\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss EC Epiplan Apochromat 100X HD DIC represents the pinnacle of high-magnification objective design for reflected light (epi-illumination) microscopy, combining apochromatic correction, exceptional numerical aperture, and multi-contrast capability for the most demanding industrial and research applications. As part of Zeiss's premium EC (Extended Contrast) Epiplan Apochromat series, this objective delivers exceptional chromatic correction across an extended wavelength range, ensuring accurate color reproduction and minimal chromatic aberration when examining reflective specimens. The apochromatic optical design provides superior color fidelity compared to fluorite or achromat objectives, making it ideal for applications requiring precise color analysis and multi-wavelength imaging. The \"HD DIC\" designation indicates compatibility with Brightfield, Darkfield (HD - High Definition), and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a high 100X magnification and exceptional 0.95 numerical aperture, this objective provides the maximum resolving power for detailed examination of the finest surface features, while the 0.21mm working distance accommodates standard specimens. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of DIC prisms and other optical accessories. This objective is in new\/open box condition, offering top-tier multi-contrast performance with apochromatic correction.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eHigh-resolution metallurgical analysis with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control requiring apochromatic correction\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMulti-wavelength imaging and color analysis\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis with enhanced contrast\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection at highest magnification\u003c\/li\u003e\n\u003cli\u003eResearch applications requiring superior optical quality\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss EC Epiplan Apochromat 100X HD DIC \/ 422692-9961\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.95\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEC Epiplan Apochromat, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eChromatic Correction\u003c\/td\u003e\n\u003ctd\u003eApochromat (superior color correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield (HD), DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e0.21mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, semiconductor inspection, multi-contrast imaging, research\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eNew \/ open box\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695622029613,"sku":"422692-9961","price":5600.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-422692-9961-2.gif?v=1765531956"},{"product_id":"zeiss-epiplan-neofluar-1-25x-objective","title":"Zeiss EPIPLAN NEOFLUAR 1.25x Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 1.25X Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 Ultra-low-magnification Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 1.25X magnification with 0.035 numerical aperture for maximum field coverage\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n📏 3.9mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 Standard RMS thread compatible with Zeiss infinity-corrected microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 1.25X is an ultra-low-magnification objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring maximum field coverage. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with epi-illumination optimization, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard achromat objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. With an ultra-low 1.25X magnification, this objective provides the widest possible field of view, making it ideal for whole-specimen overview, large area screening, defect detection across wide areas, and initial specimen localization before switching to higher magnifications. The 3.9mm working distance accommodates standard specimens and provides adequate clearance for routine reflected light microscopy. The infinity-corrected optical design ensures compatibility with modern Zeiss microscope systems and allows for the insertion of optical accessories such as polarizers, DIC prisms, and beam splitters without compromising image quality. This objective is in excellent condition with flawless optics, offering professional-grade performance for laboratories and quality control facilities using Zeiss Axio, Axiophot, and other infinity-corrected reflected light microscopes.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science overview imaging\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer screening and large area inspection\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and defect detection\u003c\/li\u003e\n\u003cli\u003eFailure analysis and forensic examination\u003c\/li\u003e\n\u003cli\u003eWhole-specimen overview and specimen localization\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection and screening\u003c\/li\u003e\n\u003cli\u003eGeological and mineralogical sample examination\u003c\/li\u003e\n\u003cli\u003eBrightfield and darkfield reflected light microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 1.25X \/ 442300\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e1.25X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.035\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e3.9mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eRMS (Royal Microscopical Society) standard\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss infinity-corrected reflected light microscopes (Axio, Axiophot series)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, industrial QC\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695644246317,"sku":"442300","price":995.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442300-2.jpg?v=1765533224"},{"product_id":"zeiss-epiplan-neofluar-2-5x-objective","title":"Zeiss Epiplan-Neofluar 2.5x Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 2.5X Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 2.5X magnification with 0.075 numerical aperture for wide-field observation\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n📏 Generous 8.6mm working distance ideal for large specimens and manipulation\u003cbr\u003e\n🔧 Standard RMS thread compatible with Zeiss infinity-corrected microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 2.5X is a specialized low-magnification objective engineered specifically for reflected light (epi-illumination) microscopy applications. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with epi-illumination optimization, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard achromat objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. With a low 2.5X magnification, this objective provides an exceptionally wide field of view, making it ideal for specimen overview, large area inspection, defect screening, and initial examination before switching to higher magnifications. The generous 8.6mm working distance provides ample clearance for thick specimens, wafers, and samples requiring manipulation or measurement. The infinity-corrected optical design ensures compatibility with modern Zeiss microscope systems and allows for the insertion of optical accessories such as polarizers, DIC prisms, and beam splitters without compromising image quality. This objective is in excellent condition with flawless optics, offering professional-grade performance for laboratories and quality control facilities using Zeiss Axio, Axiophot, and other infinity-corrected reflected light microscopes.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect screening\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis and forensic examination\u003c\/li\u003e\n\u003cli\u003eLarge specimen overview and navigation\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection\u003c\/li\u003e\n\u003cli\u003eGeological and mineralogical sample examination\u003c\/li\u003e\n\u003cli\u003eBrightfield and darkfield reflected light microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 2.5X \/ 442310\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e2.5X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.075\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e8.6mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eRMS (Royal Microscopical Society) standard\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss infinity-corrected reflected light microscopes (Axio, Axiophot series)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, industrial QC\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695644279085,"sku":"442310","price":495.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442310-2.jpg?v=1765533240"},{"product_id":"zeiss-epiplan-neofluar-20x-brightfield-darkfield-objective","title":"Zeiss Epiplan-Neofluar 20x Brightfield Darkfield Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 20X BD Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 20X magnification with 0.50 numerical aperture for versatile imaging\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Dual-contrast capability: Brightfield and Darkfield compatible\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Light use with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 20X BD is a versatile dual-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring both brightfield and darkfield observation techniques at mid-magnification. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with dual-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD\" designation indicates compatibility with both Brightfield and Darkfield imaging modes, making this objective versatile for revealing different types of surface features and defects. With a 20X magnification and 0.50 numerical aperture, this objective provides excellent resolution for detailed examination while maintaining a useful field of view. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of optical accessories. This objective shows light use but features flawless optics, offering professional-grade dual-contrast performance.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with brightfield and darkfield\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect detection\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection\u003c\/li\u003e\n\u003cli\u003eDual-contrast reflected light microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 20X BD \/ 442344\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e20X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.50\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, dual-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eLight use, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695644311853,"sku":"442344","price":695.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442344-2.jpg?v=1765533256"},{"product_id":"zeiss-epiplan-neofluar-20x-brightfield-darkfield-dic-objective","title":"Zeiss Epiplan-Neofluar 20x Brightfield Darkfield DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 20X BD DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 20X magnification with 0.50 numerical aperture for versatile imaging\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 20X BD DIC is a versatile multi-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring multiple observation techniques at mid-magnification. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a 20X magnification and 0.50 numerical aperture, this objective provides excellent resolution for detailed examination while maintaining a useful field of view. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of DIC prisms and other optical accessories. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 20X BD DIC \/ 442345\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e20X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.50\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695644344621,"sku":"442345","price":750.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442345-2.jpg?v=1765533272"},{"product_id":"zeiss-epiplan-neofluar-50x-brightfield-darkfield-objective","title":"Zeiss Epiplan-Neofluar 50x Brightfield Darkfield Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 50X BD Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 50X magnification with 0.75 numerical aperture for high resolution\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Dual-contrast capability: Brightfield and Darkfield compatible\u003cbr\u003e\n📏 0.54mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 50X BD is a premium dual-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring both brightfield and darkfield observation techniques. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with dual-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD\" designation indicates compatibility with both Brightfield and Darkfield imaging modes, making this objective versatile for revealing different types of surface features and defects. With a high 50X magnification and 0.75 numerical aperture, this objective provides excellent resolution for detailed examination of fine surface features, while the 0.54mm working distance accommodates standard specimens. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of optical accessories. This objective is in excellent condition with flawless optics, offering professional-grade dual-contrast performance.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with brightfield and darkfield\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect detection\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection\u003c\/li\u003e\n\u003cli\u003eFine surface feature analysis\u003c\/li\u003e\n\u003cli\u003eDual-contrast reflected light microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 50X BD \/ 442354\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e50X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.75\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e0.54mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, dual-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695644737837,"sku":"442354","price":700.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442354-2.jpg?v=1765533288"},{"product_id":"zeiss-epiplan-neofluar-50x-brightfield-darkfield-dic-objective","title":"Zeiss Epiplan-Neofluar 50x Brightfield Darkfield DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 50X BD DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 50X magnification with 0.80 numerical aperture for exceptional resolution\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e\n📏 0.54mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 50X BD DIC is a premium multi-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring multiple observation techniques and exceptional optical quality. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a high 50X magnification and 0.80 numerical aperture, this objective provides outstanding resolution for detailed examination of fine surface features, while the 0.54mm working distance accommodates standard specimens. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of DIC prisms and other optical accessories. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eFine surface feature analysis\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 50X BD DIC \/ 442355\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e50X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.80\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e0.54mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695645589805,"sku":"442355","price":900.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442355-2.jpg?v=1765533303"},{"product_id":"zeiss-epiplan-neofluar-100x-brightfield-darkfield-objective","title":"Zeiss Epiplan-Neofluar 100x Brightfield Darkfield Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 100X BD Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 100X magnification with 0.90 numerical aperture for exceptional resolution\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Dual-contrast capability: Brightfield and Darkfield compatible\u003cbr\u003e\n📏 0.32mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 100X BD is a premium dual-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring both brightfield and darkfield observation techniques at high magnification. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with dual-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD\" designation indicates compatibility with both Brightfield and Darkfield imaging modes, making this objective versatile for revealing different types of surface features and defects. With a high 100X magnification and exceptional 0.90 numerical aperture, this objective provides outstanding resolution for detailed examination of fine surface features, while the 0.32mm working distance accommodates standard specimens. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of optical accessories. This objective is in excellent condition with flawless optics, offering professional-grade dual-contrast performance at high magnification.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with brightfield and darkfield\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect detection\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection\u003c\/li\u003e\n\u003cli\u003eFine surface feature analysis at high magnification\u003c\/li\u003e\n\u003cli\u003eDual-contrast reflected light microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 100X BD \/ 442384\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.90\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e0.32mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, dual-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695646179629,"sku":"442384","price":850.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442384-2.jpg?v=1765533319"},{"product_id":"zeiss-epiplan-neofluar-100x-brightfield-darkfield-dic-objective","title":"Zeiss Epiplan-Neofluar 100x Brightfield Darkfield DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan-Neofluar 100X BD DIC Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance Epiplan-Neofluar objective for reflected light microscopy\u003cbr\u003e\n🎯 100X magnification with 0.90 numerical aperture for exceptional resolution\u003cbr\u003e\n🌈 Neofluar optics deliver superior chromatic correction and high contrast\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e\n📏 0.32mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan-Neofluar 100X BD DIC is a premium multi-contrast objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring multiple observation techniques and exceptional optical quality at high magnification. As part of Zeiss's renowned Epiplan-Neofluar series, this objective combines advanced Neofluar optical design with multi-contrast capability, delivering superior chromatic correction, high contrast, and excellent flatness of field for industrial inspection, materials science, and metallurgical applications. The Neofluar optical formula provides enhanced color correction compared to standard objectives, ensuring accurate color reproduction and improved image quality when examining metal surfaces, semiconductors, and other reflective specimens. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a high 100X magnification and exceptional 0.90 numerical aperture, this objective provides outstanding resolution for detailed examination of fine surface features, while the 0.32mm working distance accommodates standard specimens. The M27 thread ensures compatibility with modern Zeiss Axio series microscopes, and the infinity-corrected optical design allows for the insertion of DIC prisms and other optical accessories. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance at high magnification.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eFine surface feature analysis at high magnification\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan-Neofluar 100X BD DIC \/ 442385\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.90\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan-Neofluar, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e0.32mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eNeofluar (enhanced chromatic correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695646409005,"sku":"442385","price":1100.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442385-2.jpg?v=1765533336"},{"product_id":"zeiss-epiplan-apochromat-150x-objective","title":"ZEISS EPIPLAN APOCHROMAT 150X OBJECTIVE","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss Epiplan Apochromat 150X Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 Ultra-premium Epiplan Apochromat objective for reflected light microscopy\u003cbr\u003e\n🎯 150X magnification with 0.95 numerical aperture for maximum resolution\u003cbr\u003e\n🌈 Apochromatic correction delivers superior color fidelity across the spectrum\u003cbr\u003e\n📏 0.23mm working distance suitable for standard specimen preparations\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ New condition\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss Epiplan Apochromat 150X represents the pinnacle of ultra-high-magnification objective design for reflected light (epi-illumination) microscopy, combining apochromatic correction with exceptional numerical aperture for the most demanding industrial and research applications. As part of Zeiss's premium Epiplan Apochromat series, this objective delivers exceptional chromatic correction across an extended wavelength range, ensuring accurate color reproduction and minimal chromatic aberration when examining reflective specimens. The apochromatic optical design provides superior color fidelity compared to fluorite or achromat objectives, making it ideal for applications requiring precise color analysis and multi-wavelength imaging. With an ultra-high 150X magnification and exceptional 0.95 numerical aperture, this objective provides the maximum resolving power available for reflected light microscopy, enabling visualization of the finest surface features, defects, and microstructural details. The 0.23mm working distance accommodates standard specimens while maintaining the high NA essential for maximum resolution. The infinity-corrected optical design ensures compatibility with modern Zeiss Axio microscope systems and allows for the insertion of optical accessories such as polarizers and beam splitters. The M27 thread ensures seamless integration with Zeiss Axio series microscopes. This objective is in new condition, offering top-tier performance for laboratories requiring the absolute highest optical quality and resolution for reflected light microscopy.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eUltra-high-resolution metallurgical analysis\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect analysis\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control requiring maximum resolution\u003c\/li\u003e\n\u003cli\u003eFailure analysis and forensic examination\u003c\/li\u003e\n\u003cli\u003eFine microstructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection at highest magnification\u003c\/li\u003e\n\u003cli\u003eMulti-wavelength imaging and color analysis\u003c\/li\u003e\n\u003cli\u003eResearch applications requiring apochromatic correction\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss Epiplan Apochromat 150X \/ 442690\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e150X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.95\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eEpiplan Apochromat, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eChromatic Correction\u003c\/td\u003e\n\u003ctd\u003eApochromat (superior color correction)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e0.23mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eUltra-high-resolution metallurgy, semiconductor inspection, research\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eNew\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695646671149,"sku":"ZEISS-442690","price":2295.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442690-2.jpg?v=1765533351"},{"product_id":"zeiss-ld-epiplan-20x-objective","title":"ZEISS LD EPIPLAN 20X OBJECTIVE","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD Epiplan 20X Long Working Distance Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance LD Epiplan objective for reflected light microscopy\u003cbr\u003e\n🎯 20X magnification with 0.40 numerical aperture for versatile imaging\u003cbr\u003e\n📏 Long working distance for thick specimens and manipulation\u003cbr\u003e\n🔧 RMS thread compatible with Zeiss infinity-corrected microscope systems\u003cbr\u003e\n✨ Excellent condition\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD Epiplan 20X is a versatile long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring extended working distance at mid-magnification. As part of Zeiss's LD (Long Distance) Epiplan series, this objective combines 20X magnification with extended working distance, providing excellent clearance for thick specimens, wafers, and samples requiring manipulation or measurement. With a numerical aperture of 0.40, this objective delivers good resolution and light-gathering capability for detailed examination of metal surfaces, semiconductors, and other reflective specimens. The infinity-corrected optical design ensures compatibility with modern Zeiss microscope systems and allows for the insertion of optical accessories such as polarizers and beam splitters without compromising image quality. Featuring standard RMS threading, this objective integrates seamlessly with Zeiss Axio and other infinity-corrected reflected light microscopes. This objective is in excellent condition, offering professional-grade performance for laboratories and quality control facilities conducting metallurgical analysis, semiconductor inspection, and materials characterization at mid-magnification.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis and forensic examination\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection\u003c\/li\u003e\n\u003cli\u003eThick specimen imaging\u003c\/li\u003e\n\u003cli\u003eBrightfield reflected light microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD Epiplan 20X \/ 442840\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e20X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.40\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD Epiplan, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003eLong working distance\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eRMS (Royal Microscopical Society) standard\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss infinity-corrected reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695646933293,"sku":"442840","price":450.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442840-2.jpg?v=1765533367"},{"product_id":"zeiss-ld-epiplan-20x-hd-dic-objective","title":"Zeiss LD Epiplan 20x HD DIC Objective","description":"ZEISS EPIPLAN NEOFLUAR 20X DIC LONG WORKING DISTANCE BRIGHTFIELD DARKFIELD OBJECTIVE FOR REFLECTED LIGHT APPLICATIONS . INFINITY CORRECTED. ZEISS CATALOG 44 28 45. OBJECTIVE IS IN EXCELLENT AS NEW CONDITION.\u003cbr\u003e\u003cbr\u003eTOLL FREE: 866.486.6791\u003cbr\u003e\u003cbr\u003eLOCAL\/OUTSIDE U.S. 585.770.1757","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695647260973,"sku":"ZEISS-442845","price":1000.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442845-2.jpg?v=1765533383"},{"product_id":"zeiss-ld-epiplan-50x-long-working-distance-objective-448250","title":"Zeiss LD Epiplan 50x Long Working Distance Objective 448250","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD Epiplan 50X Long Working Distance Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance LD Epiplan objective for reflected light microscopy\u003cbr\u003e\n🎯 50X magnification with 0.50 numerical aperture for detailed imaging\u003cbr\u003e\n📏 Extra-long 7.0mm working distance ideal for thick specimens and manipulation\u003cbr\u003e\n🔧 RMS thread (M27 adapter available upon request) compatible with Zeiss microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD Epiplan 50X is a specialized long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring exceptional working distance at high magnification. As part of Zeiss's LD (Long Distance) Epiplan series, this objective combines 50X magnification with an exceptionally long 7.0mm working distance—among the longest available for this magnification class—making it ideal for examining thick specimens, wafers, samples requiring extensive manipulation, or applications where ample clearance is essential. With a numerical aperture of 0.50, this objective provides excellent resolution for detailed examination of metal surfaces, semiconductors, and other reflective specimens, while the extended working distance provides exceptional clearance for measurement tools, probes, and optical accessories. The infinity-corrected optical design ensures compatibility with modern Zeiss microscope systems and allows for the insertion of optical components without compromising image quality. Featuring standard RMS threading with optional M27 adapter availability, this objective integrates seamlessly with Zeiss Axio and other infinity-corrected reflected light microscopes. This objective is in excellent condition with flawless optics, offering professional-grade performance for laboratories and quality control facilities requiring maximum working distance at 50X magnification.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection with probe access\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring manipulation access\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis with measurement tools\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection\u003c\/li\u003e\n\u003cli\u003eThick specimen imaging requiring maximum working distance\u003c\/li\u003e\n\u003cli\u003eBrightfield reflected light microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD Epiplan 50X \/ 442850\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e50X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.50\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD Epiplan, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e7.0mm (extra-long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eRMS (M27 adapter available upon request)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss infinity-corrected reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, probe access\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695647555885,"sku":"442850","price":1300.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442850-2.gif?v=1765533400"},{"product_id":"zeiss-ld-epiplan-50x-long-working-distance-objective","title":"Zeiss LD Epiplan 50x Long Working Distance Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD Epiplan 50X Long Working Distance Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance LD Epiplan objective for reflected light microscopy\u003cbr\u003e\n🎯 50X magnification with 0.60 numerical aperture for exceptional resolution\u003cbr\u003e\n📏 Long 3.5mm working distance suitable for thick specimens\u003cbr\u003e\n🔧 RMS thread (M27 adapter available upon request) compatible with Zeiss microscope systems\u003cbr\u003e\n✨ Excellent condition\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD Epiplan 50X is a high-performance long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring extended working distance at high magnification. As part of Zeiss's LD (Long Distance) Epiplan series, this objective combines 50X magnification with a 3.5mm working distance, providing excellent clearance for thick specimens, wafers, and samples requiring manipulation or measurement. With a numerical aperture of 0.60, this objective delivers exceptional resolution and light-gathering capability for detailed examination of metal surfaces, semiconductors, and other reflective specimens. The infinity-corrected optical design ensures compatibility with modern Zeiss microscope systems and allows for the insertion of optical accessories without compromising image quality. Featuring standard RMS threading with optional M27 adapter availability, this objective integrates seamlessly with Zeiss Axio and other infinity-corrected reflected light microscopes. This objective is in excellent condition, offering professional-grade performance for laboratories and quality control facilities conducting metallurgical analysis, semiconductor inspection, and materials characterization.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect analysis\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis and forensic examination\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection\u003c\/li\u003e\n\u003cli\u003eThick specimen imaging requiring long working distance\u003c\/li\u003e\n\u003cli\u003eBrightfield reflected light microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD Epiplan 50X \/ 442851\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e50X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.60\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD Epiplan, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e3.5mm (long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eRMS (M27 adapter available upon request)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss infinity-corrected reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695647785261,"sku":"442851","price":1300.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442851-2.jpg?v=1765533416"},{"product_id":"zeiss-ld-epiplan-50x-hd-dic-objective","title":"Zeiss LD Epiplan 50x HD DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD Epiplan 50X HD DIC Long Working Distance Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance LD Epiplan objective for reflected light microscopy\u003cbr\u003e\n🎯 50X magnification with 0.50 numerical aperture for detailed imaging\u003cbr\u003e\n🔆 Multi-contrast capability: Brightfield, Darkfield (HD), and DIC compatible\u003cbr\u003e\n📏 Extra-long 6.5mm working distance ideal for thick specimens and manipulation\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD Epiplan 50X HD DIC is a versatile long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring multiple observation techniques and extended working distance. As part of Zeiss's LD (Long Distance) Epiplan series, this objective combines high-magnification imaging with an exceptionally long 6.5mm working distance, making it ideal for examining thick specimens, wafers, and samples requiring manipulation or measurement. The \"HD DIC\" designation indicates compatibility with Brightfield, Darkfield (HD - High Definition), and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a 50X magnification and 0.50 numerical aperture, this objective provides excellent resolution for detailed examination of metal surfaces, semiconductors, and other reflective specimens, while the long working distance provides ample clearance for DIC prisms, polarizers, and other optical accessories. The infinity-corrected optical design ensures compatibility with modern Zeiss Axio microscope systems and allows for the insertion of optical components without compromising image quality. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance for laboratories and quality control facilities using Zeiss Axio reflected light microscopes.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eThick specimen imaging requiring long working distance\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD Epiplan 50X HD DIC \/ 442855\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e50X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.50\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD Epiplan, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield (HD), DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e6.5mm (long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695647818029,"sku":"442855","price":1200.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442855-2.jpg?v=1765533432"},{"product_id":"zeiss-ld-epiplan-neofluar-100x-brightfield-darkfield-dic-objective","title":"Zeiss LD Epiplan-Neofluar 100x Brightfield Darkfield DIC Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003eZeiss LD Epiplan 100X BD DIC Long Working Distance Microscope Objective for Reflected Light Microscopy\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n🔬 High-performance LD Epiplan objective for reflected light microscopy\u003cbr\u003e\n🎯 100X magnification with 0.75 numerical aperture for exceptional resolution\u003cbr\u003e\n🔦 Multi-contrast capability: Brightfield, Darkfield, and DIC compatible\u003cbr\u003e\n📏 Long 3mm working distance ideal for thick specimens and manipulation\u003cbr\u003e\n🔧 M27 thread compatible with Zeiss Axio series microscope systems\u003cbr\u003e\n✨ Excellent condition with flawless optics\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔧 Product Description\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\nThe Zeiss LD Epiplan 100X BD DIC is a premium long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring exceptional working distance, multiple observation techniques, and high-magnification imaging. As part of Zeiss's LD (Long Distance) Epiplan series, this objective combines 100X magnification with a 3mm working distance—significantly longer than standard 100X objectives—making it ideal for examining thick specimens, wafers, and samples requiring manipulation or measurement at high magnification. The \"BD DIC\" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a high numerical aperture of 0.75, this objective provides outstanding resolution for detailed examination of metal surfaces, semiconductors, and other reflective specimens, while the long working distance provides ample clearance for DIC prisms, polarizers, and other optical accessories. The infinity-corrected optical design ensures compatibility with modern Zeiss Axio microscope systems and allows for the insertion of optical components without compromising image quality. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance at high magnification with extended working distance.\n\u003c\/p\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e🔎 Typical Applications\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallurgical analysis and materials science with multiple contrast modes\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer inspection and defect characterization\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and surface inspection\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring brightfield, darkfield, and DIC imaging\u003c\/li\u003e\n\u003cli\u003eMicrostructural analysis and grain boundary examination\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) inspection with enhanced contrast\u003c\/li\u003e\n\u003cli\u003eHigh-magnification imaging requiring long working distance\u003c\/li\u003e\n\u003cli\u003eMulti-contrast reflected light microscopy for comprehensive analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cstrong\u003e📊 Key Specifications\u003c\/strong\u003e\u003c\/p\u003e\n\u003ctable border=\"1\" cellpadding=\"8\" cellspacing=\"0\" style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003ctd style=\"width: 40%;\"\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd style=\"width: 60%;\"\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Catalog Number\u003c\/td\u003e\n\u003ctd\u003eZeiss LD Epiplan 100X BD DIC \/ 442885\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.75\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLD Epiplan, Infinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected light (epi-illumination)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Modes\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield, DIC (Differential Interference Contrast)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e3mm (long working distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Type\u003c\/td\u003e\n\u003ctd\u003eM27 (27mm metric thread)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatibility\u003c\/td\u003e\n\u003ctd\u003eZeiss Axio series reflected light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eRecommended Applications\u003c\/td\u003e\n\u003ctd\u003eMetallurgy, materials science, semiconductor inspection, multi-contrast imaging\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent, flawless optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cem\u003eUniversity purchase orders are welcome and accepted. Please contact us for institutional pricing and procurement assistance.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695648178477,"sku":"442885","price":1500.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/ZEISS-442885-2.jpg?v=1765533448"}],"url":"https:\/\/www.spachoptics.com\/collections\/industrial-reflected-light.oembed","provider":"Spach Optics, Inc.","version":"1.0","type":"link"}