{"title":"Industrial Infinity Corrected O-N","description":"","products":[{"product_id":"nikon-cf-plan-20x-elwd-epi-objective","title":"NIKON CF PLAN 20X ELWD EPI OBJECTIVE","description":"\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; background-color: rgb(255, 255, 255);\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNIKON CF PLAN 20X ELWD EPI OBJECTIVE\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; background-color: rgb(255, 255, 255);\"\u003e\u003cul style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; letter-spacing: normal; background-color: rgb(255, 255, 255);\"\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eRMS THREAD\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eINFINITY CORRECTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eWORKING DISTANCE: 11 MM\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNUMERICAL APERTURE: 0.40\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCONDITION: EXCELLENT, CLEAR OPTICS\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eUNIVERSITY PURCHASE ORDERS ACCEPTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; background-color: rgb(255, 255, 255); font-weight: 700;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; background-color: rgb(255, 255, 255);\"\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(70, 70, 70);  font-size: 14px; background-color: rgb(255, 255, 255); font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-size: 16px;\"\u003eTHANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS \u003c\/span\u003e\u003c\/span\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695239463213,"sku":"CF-PLAN-20X-ELWD","price":625.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/CF-PLAN-20X-ELWD-2.jpg?v=1765508757"},{"product_id":"nikon-epi-lu-plan-fluor-10x-reflected-light-objective","title":"Nikon LU Plan Fluor 10x Reflected Light Objective","description":"\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔬 \u003cstrong\u003eEpi reflected light objective\u003c\/strong\u003e for infinity-corrected industrial microscope systems\u003cbr\u003e⚡ \u003cstrong\u003eLU Plan Fluor optical design\u003c\/strong\u003e for flat, high-contrast, high-throughput brightfield imaging\u003cbr\u003e🎯 \u003cstrong\u003e10x magnification\u003c\/strong\u003e — versatile mid-range field of view for inspection and analysis\u003cbr\u003e🔧 \u003cstrong\u003eM32 thread mount\u003c\/strong\u003e — fits Nikon reflected light microscopes with LU nosepiece\u003cbr\u003e🏆 \u003cstrong\u003eExcellent condition\u003c\/strong\u003e — flawless optics\u003cbr\u003e🇯🇵 \u003cstrong\u003eMade in Japan\u003c\/strong\u003e by Nikon\u003c\/p\u003e\n\u003chr\u003e\n\u003ch2\u003e🔧 Product Description\u003c\/h2\u003e\n\u003cp\u003eThe \u003cstrong\u003eNikon LU Plan Fluor 10x Reflected Light Objective\u003c\/strong\u003e (SKU: MUE10100) is an infinity-corrected, epi-illumination objective designed for Nikon's industrial reflected light microscope systems, including the Nikon LV, MM, and Eclipse L series with LU nosepieces. The LU Plan Fluor optical design delivers exceptional flatness of field and high light transmission across the full image area, making it a reliable workhorse for mid-magnification surface inspection and analysis. At 10x, this objective strikes the ideal balance between field of view and resolving power — wide enough for efficient sample navigation, detailed enough to identify surface features, defects, and structures with clarity. This unit is in excellent condition with flawless optics, offering outstanding value compared to new.\u003c\/p\u003e\n\u003chr\u003e\n\u003ch2\u003e🔎 Typical Applications\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eSemiconductor and wafer surface inspection\u003c\/li\u003e\n\u003cli\u003ePCB and electronics component inspection\u003c\/li\u003e\n\u003cli\u003eMetallurgical and materials surface analysis\u003c\/li\u003e\n\u003cli\u003eThin film, coating, and plating inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and failure analysis\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control workflows\u003c\/li\u003e\n\u003cli\u003eResearch and university laboratory use\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch2\u003e📊 Key Specifications\u003c\/h2\u003e\n\u003ctable\u003e\n\u003cthead\u003e\u003ctr\u003e\n\u003cth\u003eSpecification\u003c\/th\u003e\n\u003cth\u003eDetails\u003c\/th\u003e\n\u003c\/tr\u003e\u003c\/thead\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e10x\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical System\u003c\/td\u003e\n\u003ctd\u003eInfinity Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLU Plan Fluor\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eEpi (Reflected Light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Method\u003c\/td\u003e\n\u003ctd\u003eBrightfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.30\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e17.5 mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Mount\u003c\/td\u003e\n\u003ctd\u003eM32 (Nikon LU Nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eImmersion\u003c\/td\u003e\n\u003ctd\u003eDry\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eTube Length\u003c\/td\u003e\n\u003ctd\u003eInfinity\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatible Systems\u003c\/td\u003e\n\u003ctd\u003eNikon LV, MM, Eclipse L series (LU nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCatalog Number\u003c\/td\u003e\n\u003ctd\u003eMUE10100\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eSKU\u003c\/td\u003e\n\u003ctd\u003eMUE10100\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCountry of Origin\u003c\/td\u003e\n\u003ctd\u003eJapan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp\u003e\u003cem\u003eUniversity and institutional customers are welcome to use a purchase order. Please contact us for PO terms and net payment options.\u003c\/em\u003e\u003c\/p\u003e","brand":"Nikon","offers":[{"title":"Default Title","offer_id":51695312077101,"sku":"MUE10100","price":525.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/LU-PLAN-FLUOR-10X-2.jpg?v=1765513252"},{"product_id":"nikon-lu-plan-flour-20x-epi-reflected-light-objective","title":"Nikon LU Plan Flour 20x Epi Reflected Light Objective","description":"\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNIKON LU PLAN FLUOR 20X BRIGHTFIELD OBJECTIVE LENS\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cul style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; letter-spacing: normal; background-color: rgb(255, 255, 255);\"\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eM25 THREAD\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eINFINITY CORRECTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCOMPATIBLE WITH: NIKON REFLECTED LIGHT MICROSCOPES \u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eWORKING DISTANCE: 4.5 MM\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNUMERICAL APERTURE: 0.45\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCATALOG NUMBER: MUE10200\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCONDITION: EXCELLENT, FLAWLESS OPTICS\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eUNIVERSITY PURCHASE ORDERS ACCEPTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; font-weight: 700;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(70, 70, 70);  font-size: 14px; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-size: 16px;\"\u003eTHANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS\u003c\/span\u003e\u003c\/span\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695312470317,"sku":"LU-PLAN-FLUOR-20X","price":695.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/LU-PLAN-FLUOR-20X-2.jpg?v=1765513268"},{"product_id":"nikon-lu-plan-flour-50x-epi-reflected-light-objective","title":"Nikon LU Plan Flour 50x Epi Reflected Light Objective","description":"\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; background-color: rgb(255, 255, 255);\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNIKON LU PLAN FLUOR 50X BRIGHTFIELD OBJECTIVE\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; background-color: rgb(255, 255, 255);\"\u003e\u003cul style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; letter-spacing: normal; background-color: rgb(255, 255, 255);\"\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eM25 THREAD\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eINFINITY CORRECTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCOMPATIBLE WITH: NIKON REFLECTED LIGHT MICROSCOPES\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eWORKING DISTANCE: 1 MM\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNUMERICAL APERTURE: 0.80\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCATALOG NUMBER: MUE10500\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCONDITION: EXCELLENT, FLAWLESS OPTICS\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eUNIVERSITY PURCHASE ORDERS ACCEPTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; background-color: rgb(255, 255, 255); font-weight: 700;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; background-color: rgb(255, 255, 255);\"\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(70, 70, 70);  font-size: 14px; background-color: rgb(255, 255, 255); font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-size: 16px;\"\u003eTHANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS\u003c\/span\u003e\u003c\/span\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695312765229,"sku":"LU-PLAN-FLUOR-50X","price":925.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/LU-PLAN-FLUOR-50X-2.jpg?v=1765513284"},{"product_id":"nikon-epi-lu-plan-fluor-5x-reflected-light-objective","title":"Nikon LU Plan Fluor 5x Reflected Light Objective","description":"\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔬 \u003cstrong\u003eEpi reflected light objective\u003c\/strong\u003e for infinity-corrected industrial microscope systems\u003cbr\u003e⚡ \u003cstrong\u003eLU Plan Fluor optical design\u003c\/strong\u003e for flat, high-contrast, high-throughput brightfield imaging\u003cbr\u003e🎯 \u003cstrong\u003eLow magnification wide-area scanning\u003c\/strong\u003e — ideal for large sample overview and navigation\u003cbr\u003e🔧 \u003cstrong\u003eM32 thread mount\u003c\/strong\u003e — fits Nikon reflected light microscopes with LU nosepiece\u003cbr\u003e🏆 \u003cstrong\u003eExcellent condition\u003c\/strong\u003e — flawless optics\u003cbr\u003e🇯🇵 \u003cstrong\u003eMade in Japan\u003c\/strong\u003e by Nikon\u003c\/p\u003e\n\u003chr\u003e\n\u003ch2\u003e🔧 Product Description\u003c\/h2\u003e\n\u003cp\u003eThe \u003cstrong\u003eNikon LU Plan Fluor 5x Reflected Light Objective\u003c\/strong\u003e (SKU: MUE10050) is an infinity-corrected, epi-illumination objective designed for Nikon's industrial reflected light microscope systems, including the Nikon LV, MM, and Eclipse L series with LU nosepieces. The LU Plan Fluor optical design delivers exceptional flatness of field and high light transmission across the full image area — critical for accurate low-magnification survey work and automated stage scanning. At 5x, this objective provides a broad field of view for rapid sample navigation, region-of-interest identification, and large-area surface inspection before stepping up to higher magnifications. This unit is in excellent condition with flawless optics, offering outstanding value compared to new.\u003c\/p\u003e\n\u003chr\u003e\n\u003ch2\u003e🔎 Typical Applications\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eLarge-area wafer and semiconductor surface survey\u003c\/li\u003e\n\u003cli\u003ePCB and electronics overview inspection\u003c\/li\u003e\n\u003cli\u003eMetallurgical sample navigation and region selection\u003c\/li\u003e\n\u003cli\u003eThin film and coating uniformity screening\u003c\/li\u003e\n\u003cli\u003eAutomated stage scanning and stitching workflows\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and failure analysis\u003c\/li\u003e\n\u003cli\u003eResearch and university laboratory use\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch2\u003e📊 Key Specifications\u003c\/h2\u003e\n\u003ctable\u003e\n\u003cthead\u003e\u003ctr\u003e\n\u003cth\u003eSpecification\u003c\/th\u003e\n\u003cth\u003eDetails\u003c\/th\u003e\n\u003c\/tr\u003e\u003c\/thead\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e5x\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical System\u003c\/td\u003e\n\u003ctd\u003eInfinity Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLU Plan Fluor\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eEpi (Reflected Light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Method\u003c\/td\u003e\n\u003ctd\u003eBrightfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.15\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e20.0 mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Mount\u003c\/td\u003e\n\u003ctd\u003eM32 (Nikon LU Nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eImmersion\u003c\/td\u003e\n\u003ctd\u003eDry\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eTube Length\u003c\/td\u003e\n\u003ctd\u003eInfinity\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatible Systems\u003c\/td\u003e\n\u003ctd\u003eNikon LV, MM, Eclipse L series (LU nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCatalog Number\u003c\/td\u003e\n\u003ctd\u003eMUE10050\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eSKU\u003c\/td\u003e\n\u003ctd\u003eMUE10050\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCountry of Origin\u003c\/td\u003e\n\u003ctd\u003eJapan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp\u003e\u003cem\u003eUniversity and institutional customers are welcome to use a purchase order. Please contact us for PO terms and net payment options.\u003c\/em\u003e\u003c\/p\u003e","brand":"Nikon","offers":[{"title":"Default Title","offer_id":51695312896301,"sku":"MUE10050","price":495.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/LU-PLAN-FLUOR-5X-2.jpg?v=1765513300"},{"product_id":"nikon-cf-plan-1-5x-epi-reflected-light-infinity-corrected-objective","title":"NIKON CF PLAN 1.5X EPI REFLECTED LIGHT INFINITY CORRECTED OBJECTIVE","description":"NIKON CF PLAN 1.5X EPI REFLECTED LIGHT INFINITY CORRECTED OBJECTIVE. OBJECTIVE IS NEW IN THE BOX\u003cbr\u003e\u003cbr\u003eTOLL FREE: 866.486.6791\u003cbr\u003e\u003cbr\u003eLOCAL\/OUTSIDE U.S. 585.770.1757","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695319417133,"sku":"NIKON-1.5X-EPI","price":925.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-1.5X-EPI-1.jpg?v=1765514117"},{"product_id":"nikon-cf-plan-20x-bd-elwd-objective-infinity-corrected-working-distance-11mm","title":"NIKON CF PLAN 20X BD ELWD OBJECTIVE. INFINITY CORRECTED. WORKING DISTANCE 11MM","description":"NIKON CF PLAN 20X BD ELWD OBJECTIVE. INFINITY CORRECTED. WORKING DISTANCE 11MM. OBJECTIVE IS IN EXCELLENT AS NEW CONDITION.\u003cbr\u003e\u003cbr\u003eTOLL FREE: 866.486.6791\u003cbr\u003e\u003cbr\u003eLOCAL\/OUTSIDE U.S. 585.770.1757","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695322923309,"sku":"NIKON-81821-MUM23201","price":1500.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-81821-MUM23201-2.jpg?v=1765514639"},{"product_id":"nikon-cf-plan-50x-bd-elwd-dic-objective-infinity-corrected-working-distance-8-2mm","title":"Nikon CF Plan 50x ELWD BD DIC Objective","description":"NIKON CF PLAN 50X BD ELWD DIC OBJECTIVE. INFINITY CORRECTED. WORKING DISTANCE 8.2MM. OUTSIDE LETTERING IS WEARING..OPTICS ARE PERFECT. NIKON CATALOG NUMBER 81822 \/ MUM23501 \u003cbr\u003e\u003cbr\u003eTOLL FREE: 866.486.6791\u003cbr\u003e\u003cbr\u003eLOCAL\/OUTSIDE U.S. 585.770.1757","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695322956077,"sku":"CF-50X-BD-ELWD","price":1700.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-81822-MUM23501-2.gif?v=1765514656"},{"product_id":"nikon-cf-plan-100x-bd-elwd-dic-reflected-light-objective","title":"Nikon CF Plan 100x ELWD BD DIC Objective","description":"\u003cp\u003e\u003cstrong\u003eNikon CF Plan 100X BD ELWD DIC Reflected Light Objective\u003c\/strong\u003e\u003c\/p\u003e\u003cp\u003e🔬 \u003cstrong\u003e100X Plan objective with BD + DIC\u003c\/strong\u003e — brightfield, darkfield, and differential interference contrast in a single objective\u003cbr\u003e📏 \u003cstrong\u003e2mm extra-long working distance\u003c\/strong\u003e — exceptional clearance at 100X for large or mounted specimens\u003cbr\u003e🎯 \u003cstrong\u003e0.80 NA\u003c\/strong\u003e — high resolution for reflected light surface imaging without immersion\u003cbr\u003e🔩 \u003cstrong\u003eM25 thread, infinity corrected\u003c\/strong\u003e — compatible with Nikon reflected light industrial microscopes\u003cbr\u003e🌗 \u003cstrong\u003eBrightfield \u0026amp; darkfield in one\u003c\/strong\u003e — switch between surface illumination modes without changing objectives\u003cbr\u003e✅ \u003cstrong\u003eCondition: Flawless optics, some exterior lettering wear\u003c\/strong\u003e — optically perfect, cosmetically used\u003cbr\u003e🎓 \u003cstrong\u003eUniversity purchase orders accepted\u003c\/strong\u003e\u003c\/p\u003e\u003chr\u003e\u003ch3\u003e🔧 Product Description\u003c\/h3\u003e\u003cp\u003eThe Nikon CF Plan 100X BD ELWD DIC (MUM23901) is a premium reflected light objective combining brightfield (BD), darkfield, and differential interference contrast (DIC) capabilities in a single unit — eliminating the need to swap objectives when switching between surface imaging modes. The extra-long working distance (ELWD) of 2mm is exceptional for a 100X objective, providing generous clearance for large, mounted, or irregularly shaped specimens that would be impractical with standard working distance objectives. At 0.80 NA, it delivers high-resolution surface imaging without immersion media, making it ideal for non-contact inspection of semiconductor wafers, metals, ceramics, and other industrial materials. The M25 thread and infinity corrected design ensure compatibility with Nikon’s reflected light industrial microscope systems. Optics are in flawless condition; exterior shows some lettering wear consistent with prior use — optical performance is uncompromised. Manufactured in Japan to Nikon’s exacting standards.\u003c\/p\u003e\u003chr\u003e\u003ch3\u003e🔎 Typical Applications\u003c\/h3\u003e\u003cul\u003e\n\u003cli\u003eSemiconductor wafer and IC inspection at 100X\u003c\/li\u003e\n\u003cli\u003eMetallographic surface analysis — grain structure, coatings, and defects\u003c\/li\u003e\n\u003cli\u003eCeramics, composites, and advanced materials surface examination\u003c\/li\u003e\n\u003cli\u003eDarkfield detection of surface scratches, pits, and contamination\u003c\/li\u003e\n\u003cli\u003eDIC imaging of surface topography and thin film structures\u003c\/li\u003e\n\u003c\/ul\u003e\u003chr\u003e\u003ch3\u003e📊 Key Specifications\u003c\/h3\u003e\u003ctable\u003e\n\u003cthead\u003e\u003ctr\u003e\n\u003cth\u003eSpecification\u003c\/th\u003e\n\u003cth\u003eDetails\u003c\/th\u003e\n\u003c\/tr\u003e\u003c\/thead\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd\u003ePart Number\u003c\/td\u003e\n\u003ctd\u003eMUM23901\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture\u003c\/td\u003e\n\u003ctd\u003e0.80\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e2mm (ELWD)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread\u003c\/td\u003e\n\u003ctd\u003eM25\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical System\u003c\/td\u003e\n\u003ctd\u003eInfinity Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eTechniques\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield (BD), DIC\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eImmersion\u003c\/td\u003e\n\u003ctd\u003eDry\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatible With\u003c\/td\u003e\n\u003ctd\u003eNikon Reflected Light Microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eFlawless Optics, Some Exterior Lettering Wear\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCountry of Origin\u003c\/td\u003e\n\u003ctd\u003eJapan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\u003chr\u003e\u003cp\u003e\u003cem\u003eSpach Optics proudly accepts university purchase orders. Contact us with any questions — we’re happy to help.\u003c\/em\u003e\u003c\/p\u003e","brand":"Spach Optics, Inc.","offers":[{"title":"Default Title","offer_id":51695323021613,"sku":"MUM23901","price":1800.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-81823-2.jpg?v=1765514672"},{"product_id":"nikon-l-plan-epi-2-5x-reflected-light-objective","title":"Nikon L Plan 2.5x Reflected Light Objective","description":"\u003cp style=\"font-family:'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cstrong\u003eNikon L Plan EPI 2.5x Reflected Light Objective\u003c\/strong\u003e (cat. no. MUE00031) is a low-magnification, wide-field overview objective designed for reflected-light (EPI) microscopy on Nikon infinity-corrected systems. With a \u003cstrong\u003e2.5x magnification\u003c\/strong\u003e, \u003cstrong\u003eN.A. 0.075\u003c\/strong\u003e, and \u003cstrong\u003e8.8mm working distance\u003c\/strong\u003e, it delivers a broad field of view ideal for specimen orientation, large-area survey imaging, and macro-level surface inspection before stepping up to higher magnifications. This unit is in \u003cstrong\u003eexcellent, as-new condition\u003c\/strong\u003e, available at significant savings over new pricing.\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003e🔬 \u003cstrong\u003e2.5x magnification\u003c\/strong\u003e — wide-field overview for large specimens and macro-level surface survey\u003c\/li\u003e\n\u003cli\u003e📏 \u003cstrong\u003e8.8mm working distance\u003c\/strong\u003e with N.A. 0.075 for comfortable low-magnification imaging\u003c\/li\u003e\n\u003cli\u003e💡 \u003cstrong\u003eEPI (reflected light) design\u003c\/strong\u003e for opaque and surface-level specimen inspection\u003c\/li\u003e\n\u003cli\u003e🔩 \u003cstrong\u003eM25 thread, infinity-corrected\u003c\/strong\u003e — compatible with all Nikon infinity-corrected microscopes\u003c\/li\u003e\n\u003cli\u003e🔧 \u003cstrong\u003eBD nosepiece compatible\u003c\/strong\u003e — adapter available (contact us) for use on Nikon BD nosepieces\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eExcellent, as-new condition\u003c\/strong\u003e, inspected and verified\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch3\u003e🔧 Product Description\u003c\/h3\u003e\n\u003cp style=\"font-family:'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cstrong\u003eNikon L Plan EPI 2.5x\u003c\/strong\u003e (cat. no. MUE00031) is the standard low-magnification entry point in Nikon's L Plan EPI reflected-light objective series, designed for use on Nikon infinity-corrected upright and industrial microscopes. At 2.5x, it provides the widest field of view in the series — essential for initial specimen orientation, locating regions of interest across large surfaces, and macro-level overview imaging before transitioning to higher magnification objectives. The L Plan optical correction delivers a flat, well-corrected field suited to both visual inspection and camera-based documentation. With an \u003cstrong\u003eM25 thread\u003c\/strong\u003e and infinity-corrected design, it fits directly into Nikon's standard nosepieces; for use on \u003cstrong\u003eNikon BD (Brightfield\/Darkfield) nosepieces\u003c\/strong\u003e, a thread adapter is available — please contact us. This listing is for a unit in \u003cstrong\u003eexcellent, as-new condition\u003c\/strong\u003e — an exceptional value at well below new cost.\u003c\/p\u003e\n\u003chr\u003e\n\u003ch3\u003e🔎 Typical Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eLarge-area surface survey and specimen orientation at low magnification\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer and panel macro-level inspection\u003c\/li\u003e\n\u003cli\u003ePCB and large component overview imaging\u003c\/li\u003e\n\u003cli\u003eLocating regions of interest before switching to higher magnification objectives\u003c\/li\u003e\n\u003cli\u003eMetallurgical and materials surface overview\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control on large or complex parts\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch3\u003e📊 Key Specifications\u003c\/h3\u003e\n\u003ctable\u003e\n\u003cthead\u003e\u003ctr\u003e\n\u003cth\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/th\u003e\n\u003cth\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\u003c\/thead\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd\u003eManufacturer\u003c\/td\u003e\n\u003ctd\u003eNikon\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Part Number\u003c\/td\u003e\n\u003ctd\u003eL Plan EPI 2.5x \/ MUE00031\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e2.5x\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (N.A.)\u003c\/td\u003e\n\u003ctd\u003e0.075\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance (W.D.)\u003c\/td\u003e\n\u003ctd\u003e8.8mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread\u003c\/td\u003e\n\u003ctd\u003eM25\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical System\u003c\/td\u003e\n\u003ctd\u003eInfinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eEPI (Reflected Light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003eL Plan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eBD Nosepiece Compatibility\u003c\/td\u003e\n\u003ctd\u003eYes — adapter available (contact us)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eImmersion Medium\u003c\/td\u003e\n\u003ctd\u003eDry (Air)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent — As New\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCountry of Origin\u003c\/td\u003e\n\u003ctd\u003eJapan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp\u003e\u003cem\u003eUniversity and institutional customers are welcome to submit a purchase order. Please contact us for net terms and academic pricing.\u003c\/em\u003e\u003c\/p\u003e","brand":"Spach Optics, Inc.","offers":[{"title":"Default Title","offer_id":51695350612269,"sku":"MUE00031","price":1100.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE00031-2.gif?v=1765517665"},{"product_id":"nikon-l-plan-1x-epi-low-magnification-objective","title":"Nikon L Plan 1x EPI Low Magnification Objective","description":"\u003cspan style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box;\"\u003e\u003cb\u003e \u003cspan style=\"color: rgb(0, 0, 0); font-size: 16px;\"\u003eNIKON L PLAN 1X REFLECTED LIGHT OBJECTIVE \u003c\/span\u003e\u003c\/b\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cul style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; letter-spacing: normal; background-color: rgb(255, 255, 255);\"\u003e\n\u003cli\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px; \"\u003eM25 THREAD (WE ALSO HAVE THE ADAPTER IF OBJECTIVE IS TO BE USED ON A BD NOSEPIECE)\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px; \"\u003eINFINITY CORRECTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px; \"\u003eCOMPATIBLE WITH: ALL NIKON INFINITY CORRECTED MICROSCOPES \u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px; \"\u003eWORKING DISTANCE: 3.0 MM\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px; \"\u003eNUMERICAL APERTURE: 0.03\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px; \"\u003eCATALOG NUMBER: MUE10010\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px; \"\u003eCONDITION: NEW \u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px; \"\u003eUNIVERSITY PURCHASE ORDERS ACCEPTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0); \"\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003cb style=\"box-sizing: border-box; font-size: 14px; color: rgb(70, 70, 70); \"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-size: 16px;\"\u003eTHANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS \u003c\/span\u003e\u003c\/b\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695350677805,"sku":"NIKON-MUE10010","price":1995.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE10010-2.gif?v=1765517682"},{"product_id":"nikon-tu-plan-fluor-5x-reflected-light-objective","title":"Nikon TU Plan Fluor 5X Reflected Light Objective | MUE12050","description":"\u003cp\u003e🔬 \u003cstrong\u003eNikon TU Plan Fluor 5X Reflected Light Objective — MUE12050\u003c\/strong\u003e — an infinity-corrected Plan Fluor reflected light (episcopic) objective for Nikon industrial and upright microscopes, offering a generous 23.5mm working distance for large or tall specimen observation.\u003c\/p\u003e\u003cul\u003e\n\u003cli\u003e✅ \u003cstrong\u003e5X magnification\u003c\/strong\u003e with Plan Fluor optical correction\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eReflected light (episcopic) design\u003c\/strong\u003e for opaque specimen imaging\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eNumerical Aperture: 0.15\u003c\/strong\u003e\n\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eWorking Distance: 23.5mm\u003c\/strong\u003e — ideal for tall or mounted specimens\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eInfinity corrected\u003c\/strong\u003e — M25 thread\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eCompatible with Nikon infinity-corrected microscopes\u003c\/strong\u003e\n\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eCatalog No. MUE12050\u003c\/strong\u003e\n\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eCondition: New \/ Open Box\u003c\/strong\u003e\n\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eUniversity purchase orders accepted\u003c\/strong\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\u003chr\u003e\u003ch2\u003e🔧 Product Description\u003c\/h2\u003e\u003cp\u003eThe Nikon TU Plan Fluor 5X Reflected Light Objective (MUE12050) is an infinity-corrected episcopic objective designed for use on Nikon industrial and upright microscopes. The Plan Fluor correction delivers bright, high-contrast images with excellent flatness across the full field of view, while the 23.5mm working distance provides ample clearance for tall, mounted, or irregularly shaped specimens. The M25 thread and infinity-corrected design ensure compatibility with the full range of Nikon CFI-series industrial and biological microscope platforms. Supplied new in open box condition.\u003c\/p\u003e\u003chr\u003e\u003ch2\u003e🔎 Typical Applications\u003c\/h2\u003e\u003cul\u003e\n\u003cli\u003eReflected light (episcopic) overview imaging at 5X on Nikon industrial microscopes\u003c\/li\u003e\n\u003cli\u003eWide-field specimen navigation and area selection\u003c\/li\u003e\n\u003cli\u003eMaterials science, semiconductor, and metallurgical inspection\u003c\/li\u003e\n\u003cli\u003ePCB and electronics surface inspection\u003c\/li\u003e\n\u003cli\u003eUniversity and research laboratory use\u003c\/li\u003e\n\u003c\/ul\u003e\u003chr\u003e\u003ch2\u003e📊 Key Specifications\u003c\/h2\u003e\u003ctable\u003e\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/td\u003e\n\u003ctd\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e5X\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003ePlan Fluor\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eReflected Light (Episcopic)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.15\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e23.5mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eTube Length\u003c\/td\u003e\n\u003ctd\u003eInfinity Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread\u003c\/td\u003e\n\u003ctd\u003eM25\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCatalog No.\u003c\/td\u003e\n\u003ctd\u003eMUE12050\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eSKU\u003c\/td\u003e\n\u003ctd\u003eMUE12050\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eNew \/ Open Box\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\u003c\/table\u003e\u003chr\u003e\u003cp\u003e\u003cem\u003eUniversity purchase orders are accepted. Please contact us with any questions.\u003c\/em\u003e\u003c\/p\u003e","brand":"Nikon","offers":[{"title":"Default Title","offer_id":51695351136557,"sku":"MUE12050","price":695.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/TU_PLAN_5X_3ed5a870-66ed-4944-a61c-576acf22a6a2.jpg?v=1775690922"},{"product_id":"nikon-tu-plan-fluor-50x-objective","title":"Nikon TU Plan Fluor 50x Objective","description":"\u003cp class=\"MsoNormal\"\u003e\u003cb\u003eNikon TU Plan Fluor 50× Microscope Objective\u003c\/b\u003e\u003c\/p\u003e\n\u003cp class=\"MsoNormal\"\u003eThe \u003cb\u003eNikon TU Plan Fluor 50× Objective\u003c\/b\u003e is a high-performance fluorite objective designed for transmitted-light upright microscopy, delivering excellent contrast, flat-field correction, and high resolution across the field of view. Engineered for demanding laboratory and research environments, this objective is well suited for brightfield and contrast-enhancing techniques where clarity and color fidelity are critical.\u003c\/p\u003e\n\u003cp class=\"MsoNormal\"\u003eWith Nikon’s Plan Fluor optical design, the TU Plan Fluor 50× provides improved chromatic correction over standard achromats, making it ideal for routine research, clinical, and educational microscopy.\u003c\/p\u003e\n\u003cdiv class=\"MsoNormal\" align=\"center\" style=\"text-align: center;\"\u003e\u003chr size=\"2\" width=\"100%\" align=\"center\"\u003e\u003c\/div\u003e\n\u003cp class=\"MsoNormal\"\u003e\u003cb\u003eKey Features\u003c\/b\u003e\u003c\/p\u003e\n\u003cul style=\"margin-top: 0in;\" type=\"disc\"\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l4 level1 lfo1; tab-stops: list .5in;\"\u003e\n\u003cb\u003e50× Magnification\u003c\/b\u003e – Ideal balance of resolution and working distance\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l4 level1 lfo1; tab-stops: list .5in;\"\u003e\n\u003cb\u003ePlan Fluor Optical Design\u003c\/b\u003e – Flat field with enhanced chromatic correction\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l4 level1 lfo1; tab-stops: list .5in;\"\u003e\n\u003cb\u003eHigh Image Contrast\u003c\/b\u003e – Excellent detail for transmitted-light applications\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l4 level1 lfo1; tab-stops: list .5in;\"\u003e\n\u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e – Compatible with Nikon infinity microscope systems\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l4 level1 lfo1; tab-stops: list .5in;\"\u003e\n\u003cb\u003eNikon OEM Quality\u003c\/b\u003e – Precision-manufactured for long-term reliability\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cdiv class=\"MsoNormal\" align=\"center\" style=\"text-align: center;\"\u003e\u003chr size=\"2\" width=\"100%\" align=\"center\"\u003e\u003c\/div\u003e\n\u003cp class=\"MsoNormal\"\u003e\u003cb\u003eTypical Applications\u003c\/b\u003e\u003c\/p\u003e\n\u003cul style=\"margin-top: 0in;\" type=\"disc\"\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l3 level1 lfo2; tab-stops: list .5in;\"\u003eBrightfield microscopy\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l3 level1 lfo2; tab-stops: list .5in;\"\u003ePhase contrast (model-dependent compatibility)\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l3 level1 lfo2; tab-stops: list .5in;\"\u003eRoutine biological and clinical microscopy\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l3 level1 lfo2; tab-stops: list .5in;\"\u003eMaterials inspection and laboratory analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cdiv class=\"MsoNormal\" align=\"center\" style=\"text-align: center;\"\u003e\u003chr size=\"2\" width=\"100%\" align=\"center\"\u003e\u003c\/div\u003e\n\u003cp class=\"MsoNormal\"\u003e\u003cb\u003eCompatibility\u003c\/b\u003e\u003c\/p\u003e\n\u003cul style=\"margin-top: 0in;\" type=\"disc\"\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l2 level1 lfo3; tab-stops: list .5in;\"\u003e\n\u003cb\u003eMicroscope Type:\u003c\/b\u003e Nikon upright microscopes (infinity-corrected systems)\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l2 level1 lfo3; tab-stops: list .5in;\"\u003e\n\u003cb\u003eIllumination:\u003c\/b\u003e Reflected light\u003cbr\u003e\u003cbr\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cdiv class=\"MsoNormal\" align=\"center\" style=\"text-align: center;\"\u003e\u003chr size=\"2\" width=\"100%\" align=\"center\"\u003e\u003c\/div\u003e\n\u003cp class=\"MsoNormal\"\u003e\u003cb\u003eCondition\u003c\/b\u003e\u003c\/p\u003e\n\u003cul style=\"margin-top: 0in;\" type=\"disc\"\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l0 level1 lfo4; tab-stops: list .5in;\"\u003e\n\u003cb\u003eCondition:\u003c\/b\u003e Excellent, Flawless Optics\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l0 level1 lfo4; tab-stops: list .5in;\"\u003e\n\u003cb\u003eStatus:\u003c\/b\u003e Professionally inspected and tested for optical clarity, smooth threading, and performance\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cdiv class=\"MsoNormal\" align=\"center\" style=\"text-align: center;\"\u003e\u003chr size=\"2\" width=\"100%\" align=\"center\"\u003e\u003c\/div\u003e\n\u003cp class=\"MsoNormal\"\u003e\u003cb\u003eWhat’s Included\u003c\/b\u003e\u003c\/p\u003e\n\u003cul style=\"margin-top: 0in;\" type=\"disc\"\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l1 level1 lfo5; tab-stops: list .5in;\"\u003eNikon TU Plan Fluor 50× Objective\u003c\/li\u003e\n\u003cli class=\"MsoNormal\" style=\"mso-list: l1 level1 lfo5; tab-stops: list .5in;\"\u003eSecure professional packaging\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cdiv class=\"MsoNormal\" align=\"center\" style=\"text-align: center;\"\u003e\u003chr size=\"2\" width=\"100%\" align=\"center\"\u003e\u003c\/div\u003e\n\u003cp class=\"MsoNormal\"\u003e\u003cb\u003ePurchasing \u0026amp; Support\u003c\/b\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cspan style=\"font-size: 11.0pt; line-height: 107%; font-family: 'Calibri',sans-serif; mso-ascii-theme-font: minor-latin; mso-fareast-font-family: Calibri; mso-fareast-theme-font: minor-latin; mso-hansi-theme-font: minor-latin; mso-bidi-font-family: 'Times New Roman'; mso-bidi-theme-font: minor-bidi; mso-ansi-language: EN-US; mso-fareast-language: EN-US; mso-bidi-language: AR-SA;\"\u003eInspected and supported by \u003cb\u003eSpach Optics\u003c\/b\u003e. Our team is available to confirm compatibility with your Nikon microscope and imaging technique prior to purchase. \u003c\/span\u003e\u003cbr\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695351431469,"sku":"MUE12500","price":1400.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE12500-2.gif?v=1765517747"},{"product_id":"nikon-tu-plan-fluor-100x-objective","title":"Nikon TU Plan Fluor 100x Objective","description":"\u003cp style=\"font-family:'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cstrong\u003eNikon TU Plan Fluor 100x Reflected Light Objective\u003c\/strong\u003e is a high-performance infinity-corrected objective delivering exceptional resolution for EPI (reflected light) microscopy. With a \u003cstrong\u003eN.A. of 0.90\u003c\/strong\u003e and \u003cstrong\u003e1mm working distance\u003c\/strong\u003e, it resolves fine surface features with outstanding contrast — ideal for demanding industrial inspection, semiconductor analysis, and materials science applications. This unit is a \u003cstrong\u003edemonstration model in flawless optical condition\u003c\/strong\u003e, offered at significant savings over new pricing.\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003e🔬 \u003cstrong\u003e100x magnification\u003c\/strong\u003e with N.A. 0.90 for maximum dry-objective resolution\u003c\/li\u003e\n\u003cli\u003e💡 \u003cstrong\u003eEPI (reflected light) design\u003c\/strong\u003e for opaque and surface-level specimen inspection\u003c\/li\u003e\n\u003cli\u003e🏭 \u003cstrong\u003ePlan Fluor optical correction\u003c\/strong\u003e for flat, high-transmission field across visible wavelengths\u003c\/li\u003e\n\u003cli\u003e🔩 \u003cstrong\u003eM25 thread, infinity-corrected\u003c\/strong\u003e — compatible with Nikon infinity-corrected microscopes\u003c\/li\u003e\n\u003cli\u003e✅ \u003cstrong\u003eDemonstration model — flawless optics\u003c\/strong\u003e, inspected and verified\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch3\u003e🔧 Product Description\u003c\/h3\u003e\n\u003cp style=\"font-family:'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cstrong\u003eNikon TU Plan Fluor 100x\u003c\/strong\u003e (catalog no. MUE12900) is part of Nikon's TU Plan series of reflected-light objectives, engineered for high-NA surface imaging on opaque specimens. At N.A. 0.90, it sits at the top of the dry objective range, delivering the resolving power needed to characterize fine surface structures, defects, and microfeatures. The Plan Fluor optical design ensures excellent field flatness and strong transmission across the visible spectrum, supporting both visual inspection and camera-based imaging workflows. With an M25 thread and infinity-corrected design, it integrates directly with Nikon's broad range of infinity-corrected upright and industrial microscopes. This listing is for a \u003cstrong\u003edemonstration model in flawless optical condition\u003c\/strong\u003e — a rare opportunity to acquire a premium Nikon objective at well below new cost.\u003c\/p\u003e\n\u003chr\u003e\n\u003ch3\u003e🔎 Typical Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eSemiconductor wafer and die defect inspection at high magnification\u003c\/li\u003e\n\u003cli\u003ePCB trace, via, and solder joint analysis\u003c\/li\u003e\n\u003cli\u003eMetallurgical microstructure and surface finish examination\u003c\/li\u003e\n\u003cli\u003eMEMS and microelectronics surface characterization\u003c\/li\u003e\n\u003cli\u003ePrecision component quality control and failure analysis\u003c\/li\u003e\n\u003cli\u003eMaterials science surface imaging\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch3\u003e📊 Key Specifications\u003c\/h3\u003e\n\u003ctable\u003e\n\u003cthead\u003e\u003ctr\u003e\n\u003cth\u003e\u003cstrong\u003eSpecification\u003c\/strong\u003e\u003c\/th\u003e\n\u003cth\u003e\u003cstrong\u003eDetails\u003c\/strong\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\u003c\/thead\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd\u003eManufacturer\u003c\/td\u003e\n\u003ctd\u003eNikon\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eModel \/ Part Number\u003c\/td\u003e\n\u003ctd\u003eTU Plan Fluor 100x \/ MUE12900\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e100x\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (N.A.)\u003c\/td\u003e\n\u003ctd\u003e0.90\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance (W.D.)\u003c\/td\u003e\n\u003ctd\u003e1.0 mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread\u003c\/td\u003e\n\u003ctd\u003eM25\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical System\u003c\/td\u003e\n\u003ctd\u003eInfinity-Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIllumination Type\u003c\/td\u003e\n\u003ctd\u003eEPI (Reflected Light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Correction\u003c\/td\u003e\n\u003ctd\u003ePlan Fluor\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eImmersion Medium\u003c\/td\u003e\n\u003ctd\u003eDry (Air)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eDemonstration Model — Flawless Optics\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCountry of Origin\u003c\/td\u003e\n\u003ctd\u003eJapan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp\u003e\u003cem\u003eUniversity and institutional customers are welcome to submit a purchase order. Please contact us for net terms and academic pricing.\u003c\/em\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695351628077,"sku":"MUE12900","price":2200.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE12900-2.jpg?v=1765517763"},{"product_id":"20x-nikon-cfi60-lu-plan-epi-elwd-infinity-corrected-objective","title":"20X Nikon CFI60 LU Plan Epi ELWD Infinity Corrected Objective","description":"\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNIKON LU PLAN 20X ELWD EPI OBJECTIVE LENS \u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cul style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; letter-spacing: normal; background-color: rgb(255, 255, 255);\"\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eM25 THREAD\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eINFINITY CORRECTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCOMPATIBLE WITH: NIKON REFLECTED LIGHT MICROSCOPES\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eWORKING DISTANCE: 13 MM\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNUMERICAL APERTURE: 0.40\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCATALOG NUMBER: MUE41200\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCONDITION: EXCELLENT, AS NEW\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eUNIVERSITY PURCHASE ORDERS ACCEPTED \u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; font-weight: 700;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(70, 70, 70);  font-size: 14px; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-size: 16px;\"\u003eTHANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS\u003c\/span\u003e\u003c\/span\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695351693613,"sku":"NIKON-MUE20201","price":950.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE20201-2.jpg?v=1765517779"},{"product_id":"20x-nikon-cfi60-tu-plan-epi-elwd-infinity-corrected-objective","title":"Nikon 20x TU Plan ELWD Infinity Corrected Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eVersatile 20× industrial objective with exceptional 19mm working distance for reflected light microscopy of opaque materials and metallurgical specimens.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e20× Magnification, 0.40 NA\u003c\/b\u003e — Ideal balance of field of view and resolution for general-purpose industrial microscopy.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e19mm Extra-Long Working Distance\u003c\/b\u003e — Exceptional clearance accommodates thick specimens, fixtures, and challenging sample geometries.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eTU Plan Epi Design\u003c\/b\u003e — Flat-field correction with optimized contrast for reflected light microscopy of opaque materials.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eCFI60 Infinity-Corrected\u003c\/b\u003e — Compatible with Nikon's modern infinity optical platform for versatile system integration.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eBrand New Condition\u003c\/b\u003e — Factory-new objective with full optical performance and manufacturer specifications.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon CFI60 TU Plan Epi ELWD 20× Objective (MUE21200)\u003c\/b\u003e is a workhorse industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective is distinguished by its \u003cb\u003eexceptional 19mm working distance\u003c\/b\u003e—among the longest available for a 20× objective—enabling examination of challenging specimens that would be impossible to inspect with standard working distance objectives.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e20× magnification and 0.40 numerical aperture\u003c\/b\u003e provide an optimal balance between \u003cb\u003efield of view and resolving power\u003c\/b\u003e, making this objective ideal for initial specimen survey, feature location, and general-purpose inspection work. This magnification is particularly valuable in \u003cb\u003equality control environments\u003c\/b\u003e where operators need to quickly scan larger areas while maintaining sufficient resolution to identify defects, measure features, and characterize surface conditions.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e19mm extra-long working distance\u003c\/b\u003e is the defining feature of this objective, providing unprecedented clearance for industrial microscopy applications. This extended working distance enables examination of:\n\u003c\/p\u003e\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eThick specimens or samples mounted in fixtures\u003c\/li\u003e\n\u003cli\u003eRough or highly textured surfaces with significant topographical variation\u003c\/li\u003e\n\u003cli\u003eTilted or angled specimens requiring oblique viewing\u003c\/li\u003e\n\u003cli\u003eSamples requiring manipulation or probing during observation\u003c\/li\u003e\n\u003cli\u003eSpecimens in environmental chambers or specialized holders\u003c\/li\u003e\n\u003c\/ul\u003e\nThe generous clearance also provides \u003cb\u003eprotective margin\u003c\/b\u003e that reduces the risk of objective damage from accidental contact—a common concern in production environments where operators work quickly or examine irregularly shaped parts.\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eTU Plan (Transmitted\/Universal Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge. This is essential for accurate measurement and documentation, as it eliminates the need to refocus when examining features at different positions in the field. The \u003cb\u003eEpi (reflected light)\u003c\/b\u003e designation indicates optimization for \u003cb\u003ebrightfield reflected light microscopy\u003c\/b\u003e, with optical coatings that maximize contrast when examining opaque materials.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eCFI60 infinity-corrected optical system\u003c\/b\u003e enables integration with tube lenses, beam splitters, camera systems, and other optical accessories without introducing aberrations, providing flexibility for digital documentation, measurement, and analysis workflows.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eM25 thread mount\u003c\/b\u003e is compatible with Nikon infinity-corrected industrial microscopes including the Eclipse LV series and Epiphot series.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is \u003cb\u003ebrand new\u003c\/b\u003e, ready for demanding industrial inspection and materials analysis applications.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallographic analysis and quality control\u003c\/li\u003e\n\u003cli\u003eSemiconductor and electronics inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and characterization\u003c\/li\u003e\n\u003cli\u003eFailure analysis and root cause investigation\u003c\/li\u003e\n\u003cli\u003ePrecision machined part inspection\u003c\/li\u003e\n\u003cli\u003eMaterials science research\u003c\/li\u003e\n\u003cli\u003eForensic materials examination\u003c\/li\u003e\n\u003cli\u003eEducational and training laboratories\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUE21200\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e20×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.40\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e19mm (Extra-Long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eTU Plan Epi ELWD (Transmitted\/Universal Plan, Epi, Extra-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Mode\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eEpi (reflected light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCFI60 Infinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eField Correction\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003ePlan (flat-field)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eM25\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCompatibility\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNikon CFI60 infinity-corrected microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy of opaque materials\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNew\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695351988525,"sku":"MUE21200","price":2350.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE21200-2.gif?v=1765517795"},{"product_id":"50x-nikon-cfi60-tu-plan-epi-elwd-infinity-corrected-objective","title":"Nikon TU Plan ELWD 50x Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eHigh-resolution 50× industrial objective with extra-long working distance for reflected light microscopy of opaque materials and metallurgical specimens.\u003c\/b\u003e\u003c\/p\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e50× Magnification, High NA\u003c\/b\u003e — Excellent resolving power for detailed surface inspection and microstructural analysis.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003eExtra-Long Working Distance (ELWD)\u003c\/b\u003e — Extended clearance accommodates thick, uneven, or mounted specimens while maintaining optical performance.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eTU Plan Epi Design\u003c\/b\u003e — Flat-field correction with optimized contrast for reflected light microscopy of opaque materials.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eCFI60 Infinity-Corrected\u003c\/b\u003e — Compatible with Nikon's modern infinity optical platform for versatile system integration.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eBrand New Condition\u003c\/b\u003e — Factory-new objective with full optical performance and manufacturer specifications. \u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon CFI60 TU Plan Epi ELWD 50× Objective (MUE21500)\u003c\/b\u003e is a high-performance industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective combines \u003cb\u003emedium-high magnification with extended working distance\u003c\/b\u003e, enabling detailed inspection of complex surface features while maintaining safe clearance between the objective and specimen.\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e50× magnification\u003c\/b\u003e provides an optimal balance between \u003cb\u003efield of view and resolution\u003c\/b\u003e, making this objective ideal for examining microstructural features, grain boundaries, phase composition, and surface defects that require more detail than low-magnification objectives can provide, while offering a larger field of view than 100× objectives. This magnification range is particularly valuable for \u003cb\u003emetallographic analysis, semiconductor inspection, and quality control\u003c\/b\u003e applications where operators need to survey larger areas while maintaining the ability to resolve fine details.\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eextra-long working distance (ELWD)\u003c\/b\u003e is a critical advantage in industrial microscopy applications. Standard 50× objectives typically offer working distances of 2–3mm, which can be limiting when examining rough surfaces, tilted specimens, or samples mounted in fixtures. The extended working distance of this objective provides \u003cb\u003eprotective clearance\u003c\/b\u003e while maintaining high optical performance, reducing the risk of lens contamination or damage during routine inspection work and enabling examination of samples with significant topographical variation.\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eTU Plan (Transmitted\/Universal Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge—essential for accurate measurement, documentation, and analysis. The \u003cb\u003eEpi (reflected light)\u003c\/b\u003e designation indicates optimization for \u003cb\u003ebrightfield reflected light microscopy\u003c\/b\u003e, with optical coatings and design elements that maximize contrast and image quality when examining opaque materials.\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eCFI60 infinity-corrected optical system\u003c\/b\u003e represents Nikon's modern microscope platform, enabling integration with tube lenses, beam splitters, camera systems, and other optical accessories without introducing aberrations. This design provides flexibility for advanced imaging workflows including digital documentation, measurement, and analysis.\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis objective is compatible with \u003cb\u003eNikon upright reflected-light microscopes\u003c\/b\u003e including the Eclipse LV series, Epiphot series, and other CFI60-compatible industrial microscope systems.\u003c\/p\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is \u003cb\u003ebrand new\u003c\/b\u003e, ready for demanding industrial inspection and materials analysis applications.\u003c\/p\u003e\n\u003chr\u003e\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallographic analysis and grain structure examination\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer and die inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and coating analysis\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and failure analysis\u003c\/li\u003e\n\u003cli\u003eMaterials science research and characterization\u003c\/li\u003e\n\u003cli\u003ePrecision machined surface evaluation\u003c\/li\u003e\n\u003cli\u003eEducational and training laboratories\u003c\/li\u003e\n\u003cli\u003eForensic materials examination\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUE21500\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e50×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eTU Plan Epi ELWD (Transmitted\/Universal Plan, Epi, Extra-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eExtra-Long (ELWD)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Mode\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eEpi (reflected light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCFI60 Infinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eField Correction\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003ePlan (flat-field)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCompatibility\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNikon CFI60 upright reflected-light microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy of opaque materials\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCountry of Origin\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eJapan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNew\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695352054061,"sku":"MUE21500","price":1950.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE21500-2.gif?v=1765517811"},{"product_id":"nikon-l-plan-20x-slwd-epi-objective","title":"Nikon L Plan 20X SLWD EPI Objective","description":"\u003cspan\u003e\u003cspan style=\"font-size: 16px;\"\u003e\u003cspan style=\"color: rgb(0, 0, 0);\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003ctable width=\"100%\" cellpadding=\"0\" cellspacing=\"0\" border=\"0\" style=\"box-sizing: border-box; border-spacing: inherit; background-color: rgb(255, 255, 255); color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003ctbody style=\"box-sizing: border-box;\"\u003e\u003ctr style=\"box-sizing: border-box;\"\u003e\u003ctd style=\"box-sizing: border-box; line-height: 1.42857;\"\u003e\u003cdiv id=\"ProductDetail_ProductDetails_div\" style=\"box-sizing: border-box;\"\u003e\u003cspan id=\"product_description\" itemprop=\"description\" style=\"box-sizing: border-box; display: block; margin-bottom: 10px;\"\u003e\u003cspan style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"color: rgb(0, 0, 0);\"\u003e\u003cb\u003e\u003cspan style=\"color: rgb(0, 0, 0); font-size: 16px;\"\u003eNIKON L PLAN 20X SLWD EPI OBJECTIVE\u003c\/span\u003e\u003c\/b\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box; color: rgb(70, 70, 70); \"\u003e\u003cul style=\" font-size: 14px; box-sizing: border-box; letter-spacing: normal; color: rgb(70, 70, 70); background-color: rgb(255, 255, 255);\"\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eM32 THREAD\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eWORKING DISTANCE: 24 MM\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCATALOG NUMBER MUE30200\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCONDITION: LIGHT USE FLAWLESS OPTICS\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eUNIVERSITY PURCHASE ORDERS ACCEPTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cspan style=\"box-sizing: border-box; color: rgb(70, 70, 70);  font-weight: 700; font-size: 14px;\"\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box; color: rgb(70, 70, 70); \"\u003e\u003cspan style=\" box-sizing: border-box; color: rgb(70, 70, 70); font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0); \"\u003e\u003cspan style=\"color: rgb(0, 0, 0); font-size: 16px;\"\u003eT\u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-size: 16px; box-sizing: border-box; color: rgb(0, 0, 0); \"\u003eHANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS \u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/div\u003e\u003c\/td\u003e\u003c\/tr\u003e\u003c\/tbody\u003e\u003c\/table\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695352480045,"sku":"NIKON-MUE30200","price":1200.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE30200-2.jpg?v=1765517843"},{"product_id":"nikon-t-plan-slwd-10x-objective","title":"Nikon T Plan SLWD 10x Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eLow-magnification 10× industrial objective with extraordinary 37mm working distance for reflected light microscopy requiring exceptional clearance.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e10× Magnification, 0.20 NA\u003c\/b\u003e — Wide field of view with excellent working distance for specimen survey and low-magnification inspection.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e37mm Super-Long Working Distance\u003c\/b\u003e — Extraordinary clearance enables examination of thick specimens, large parts, and challenging sample configurations.\u003c\/li\u003e\n\u003cli\u003e🌟 \u003cb\u003eCFI60-2 Advanced Optics\u003c\/b\u003e — Employs Nikon's phase Fresnel lens technology for high NA and long working distance with superior chromatic aberration correction.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Design\u003c\/b\u003e — T Plan SLWD optics ensure compatibility with modern Nikon industrial microscope systems.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eBrand New Condition\u003c\/b\u003e — Factory-new objective with full optical performance and manufacturer specifications.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon T Plan SLWD 10× Objective (MUE31100)\u003c\/b\u003e is a specialized industrial objective designed for \u003cb\u003ereflected light microscopy applications requiring extraordinary working distance\u003c\/b\u003e. With an exceptional \u003cb\u003e37mm working distance\u003c\/b\u003e—among the longest available for any microscope objective—this lens enables examination of specimens that would be completely inaccessible with standard objectives.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e10× magnification and 0.20 numerical aperture\u003c\/b\u003e provide a \u003cb\u003ewide field of view\u003c\/b\u003e ideal for specimen survey, feature location, and low-magnification inspection. This magnification is particularly valuable for examining large parts, surveying extensive surface areas, and locating features of interest before switching to higher magnifications for detailed analysis.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e37mm super-long working distance (SLWD)\u003c\/b\u003e is the defining feature of this objective, providing unprecedented clearance for industrial microscopy applications. This extraordinary working distance enables examination of:\n\u003c\/p\u003e\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eVery thick specimens or large industrial parts\u003c\/li\u003e\n\u003cli\u003eSamples mounted in deep fixtures or specialized holders\u003c\/li\u003e\n\u003cli\u003eSpecimens with extreme topographical variation\u003c\/li\u003e\n\u003cli\u003eParts requiring extensive manipulation or probing during observation\u003c\/li\u003e\n\u003cli\u003eSamples in environmental chambers or specialized enclosures\u003c\/li\u003e\n\u003cli\u003eAssemblies or components that cannot be disassembled for inspection\u003c\/li\u003e\n\u003c\/ul\u003e\nThe exceptional clearance also provides \u003cb\u003emaximum protection\u003c\/b\u003e against objective damage, making this lens ideal for production environments where operators examine irregularly shaped parts or work quickly under time pressure.\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eCFI60-2 optical design\u003c\/b\u003e represents Nikon's advanced infinity-corrected platform, evolved from the original CFI60 system. This design employs \u003cb\u003eNikon's unique phase Fresnel lens technology\u003c\/b\u003e, which enables the combination of high numerical aperture and extremely long working distance while maintaining \u003cb\u003ehighly corrected chromatic aberration\u003c\/b\u003e. Traditional objective designs face fundamental trade-offs between working distance, numerical aperture, and aberration correction—the phase Fresnel lens approach overcomes these limitations, delivering optical performance that would be impossible with conventional lens designs.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eT Plan (Transmitted\/Universal Plan)\u003c\/b\u003e designation indicates \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge. This is particularly important at low magnifications where the field of view is large—flat-field correction eliminates the need to refocus when examining features at different positions in the field.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003einfinity-corrected design\u003c\/b\u003e enables integration with tube lenses, beam splitters, camera systems, and other optical accessories without introducing aberrations, providing flexibility for digital documentation and analysis workflows.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eM25 thread mount\u003c\/b\u003e is compatible with Nikon infinity-corrected industrial microscopes including the Eclipse LV series and other CFI60-compatible systems.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is \u003cb\u003ebrand new\u003c\/b\u003e, ready for demanding industrial inspection applications requiring exceptional working distance.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eLarge industrial part inspection\u003c\/li\u003e\n\u003cli\u003eAssembled component examination without disassembly\u003c\/li\u003e\n\u003cli\u003eSpecimens in environmental chambers or specialized fixtures\u003c\/li\u003e\n\u003cli\u003eQuality control of thick or irregularly shaped parts\u003c\/li\u003e\n\u003cli\u003eFailure analysis requiring extensive sample manipulation\u003c\/li\u003e\n\u003cli\u003eIn-situ inspection of mounted assemblies\u003c\/li\u003e\n\u003cli\u003eEducational demonstrations requiring large working clearance\u003c\/li\u003e\n\u003cli\u003eAny application where standard working distances are insufficient\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUE31100\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e10×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.20\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e37mm (Super-Long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eT Plan SLWD (Transmitted\/Universal Plan, Super-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Platform\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCFI60-2 (phase Fresnel lens technology)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Mode\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light (Epi)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eField Correction\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003ePlan (flat-field)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eM25\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCompatibility\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNikon infinity-corrected microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy requiring exceptional working distance\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNew\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695352611117,"sku":"MUE31100","price":3386.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE31100-2.gif?v=1765517858"},{"product_id":"nikon-lu-plan-fluor-10x-brightfield-darkfield-objective-lens","title":"Nikon LU Plan Fluor 10x Brightfield Darkfield Objective","description":"\u003cp style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔬 \u003cstrong\u003eBrightfield \u0026amp; darkfield capable\u003c\/strong\u003e infinity-corrected industrial objective\u003cbr\u003e⚡ \u003cstrong\u003eLU Plan Fluor optical design\u003c\/strong\u003e for exceptional flatness, contrast, and light throughput\u003cbr\u003e🎯 \u003cstrong\u003eExtra-long 15mm working distance\u003c\/strong\u003e — ideal for large or mounted specimens\u003cbr\u003e🔧 \u003cstrong\u003eM32 thread mount\u003c\/strong\u003e — fits Nikon reflected light microscopes with BD nosepiece\u003cbr\u003e🏆 \u003cstrong\u003eExcellent condition, as new\u003c\/strong\u003e — flawless optics\u003cbr\u003e🇯🇵 \u003cstrong\u003eMade in Japan\u003c\/strong\u003e by Nikon\u003c\/p\u003e\n\u003chr\u003e\n\u003ch2\u003e🔧 Product Description\u003c\/h2\u003e\n\u003cp\u003eThe \u003cstrong\u003eNikon LU Plan Fluor 10x Brightfield\/Darkfield Objective\u003c\/strong\u003e (SKU: MUE41100) is an infinity-corrected, M32-threaded objective designed for Nikon's reflected light microscope systems, including the Nikon LV, MM, and Eclipse L series with BD (brightfield\/darkfield) nosepieces. The LU Plan Fluor optical design delivers outstanding flatness of field and high light transmission, making it equally effective for routine brightfield inspection and high-contrast darkfield surface examination. With a generous 15mm working distance and 0.30 NA, this objective provides a wide, comfortable field of view for scanning large sample areas — a key advantage in industrial and materials inspection workflows. This unit is in excellent, as-new condition with flawless optics.\u003c\/p\u003e\n\u003chr\u003e\n\u003ch2\u003e🔎 Typical Applications\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eSemiconductor and wafer surface inspection\u003c\/li\u003e\n\u003cli\u003ePrinted circuit board (PCB) and electronics QC\u003c\/li\u003e\n\u003cli\u003eMetallurgical and materials science analysis\u003c\/li\u003e\n\u003cli\u003eThin film and coating inspection\u003c\/li\u003e\n\u003cli\u003eDarkfield surface defect detection\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and failure analysis\u003c\/li\u003e\n\u003cli\u003eResearch and university laboratory use\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003chr\u003e\n\u003ch2\u003e📊 Key Specifications\u003c\/h2\u003e\n\u003ctable\u003e\n\u003cthead\u003e\u003ctr\u003e\n\u003cth\u003eSpecification\u003c\/th\u003e\n\u003cth\u003eDetails\u003c\/th\u003e\n\u003c\/tr\u003e\u003c\/thead\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd\u003eMagnification\u003c\/td\u003e\n\u003ctd\u003e10x\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical System\u003c\/td\u003e\n\u003ctd\u003eInfinity Corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eOptical Design\u003c\/td\u003e\n\u003ctd\u003eLU Plan Fluor\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eContrast Methods\u003c\/td\u003e\n\u003ctd\u003eBrightfield, Darkfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd\u003e0.30\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWorking Distance\u003c\/td\u003e\n\u003ctd\u003e15 mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eThread Mount\u003c\/td\u003e\n\u003ctd\u003eM32 (Nikon BD Nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eImmersion\u003c\/td\u003e\n\u003ctd\u003eDry\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eTube Length\u003c\/td\u003e\n\u003ctd\u003eInfinity\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCompatible Systems\u003c\/td\u003e\n\u003ctd\u003eNikon LV, MM, Eclipse L series (BD nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCatalog Number\u003c\/td\u003e\n\u003ctd\u003eMUE41100\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eSKU\u003c\/td\u003e\n\u003ctd\u003eMUE41100\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCountry of Origin\u003c\/td\u003e\n\u003ctd\u003eJapan\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eCondition\u003c\/td\u003e\n\u003ctd\u003eExcellent — As New\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\n\u003chr\u003e\n\u003cp\u003e\u003cem\u003eUniversity and institutional customers are welcome to use a purchase order. Please contact us for PO terms and net payment options.\u003c\/em\u003e\u003c\/p\u003e","brand":"Nikon","offers":[{"title":"Default Title","offer_id":51695352709421,"sku":"MUE41100","price":695.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/LUPLANFLUOR10XBD.jpg?v=1778072546"},{"product_id":"nikon-lu-plan-fluor-20x-brightfield-darkfield-epi-objective","title":"Nikon LU Plan Fluor 20X Brightfield Darkfield EPI Objective","description":"\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNIKON LU PLAN FLUOR 20X BRIGHTFIELD DARKFIELD OBJECTIVE\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cul style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; letter-spacing: normal; background-color: rgb(255, 255, 255);\"\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eM32 THREAD\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eINFINITY CORRECTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCOMPATIBLE WITH: NIKON REFLECTED LIGHT MICROSCOPES WITH BD (M32) NOSEPIECE\u003c\/span\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eWORKING DISTANCE: 4.5 MM\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eNUMERICAL APERTURE: 0.45\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCATALOG NUMBER: MUE41200\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eCONDITION: EXCELLENT, AS NEW\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003e\u003cspan style=\"box-sizing: border-box; font-weight: 700; \"\u003e\u003cspan style=\"box-sizing: border-box; font-size: 16px;\"\u003eUNIVERSITY PURCHASE ORDERS ACCEPTED\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px; font-weight: 700;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0);  font-size: 14px;\"\u003e\u003cbr style=\"box-sizing: border-box;\"\u003e\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(70, 70, 70);  font-size: 14px; font-weight: 700;\"\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(0, 0, 0) !important;  font-size: 16px;\"\u003eTHANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS\u003c\/span\u003e\u003c\/span\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695352774957,"sku":"NIKON-MUE41200","price":795.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE41200-2.gif?v=1765517891"},{"product_id":"nikon-lu-plan-elwd-20x-brightfield-darkfield-objective","title":"Nikon LU Plan ELWD 20x Brightfield Darkfield Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eVersatile 20× industrial objective with exceptional 13mm working distance for brightfield and darkfield reflected light microscopy of opaque materials.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e20× Magnification, 0.40 NA\u003c\/b\u003e — Ideal balance of field of view and resolution for general-purpose industrial microscopy.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e13mm Extra-Long Working Distance\u003c\/b\u003e — Exceptional clearance accommodates thick specimens, fixtures, and challenging sample geometries.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eBrightfield \u0026amp; Darkfield Capable\u003c\/b\u003e — Dual-mode illumination reveals both surface detail and topographical features in a single objective.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e — LU Plan design ensures compatibility with modern Nikon industrial microscope systems.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eExcellent Condition, Like-New\u003c\/b\u003e — Pre-owned objective in excellent, like-new condition with pristine optical performance.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon LU Plan ELWD 20× Brightfield Darkfield Objective (MUE60201)\u003c\/b\u003e is a workhorse industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective is distinguished by its \u003cb\u003eexceptional 13mm working distance\u003c\/b\u003e—among the longest available for a 20× objective—combined with dual illumination capability, enabling examination of challenging specimens that would be impossible to inspect with standard working distance objectives.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e20× magnification and 0.40 numerical aperture\u003c\/b\u003e provide an optimal balance between \u003cb\u003efield of view and resolving power\u003c\/b\u003e, making this objective ideal for initial specimen survey, feature location, and general-purpose inspection work. This magnification is particularly valuable in \u003cb\u003equality control environments\u003c\/b\u003e where operators need to quickly scan larger areas while maintaining sufficient resolution to identify defects, measure features, and characterize surface conditions.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e13mm extra-long working distance\u003c\/b\u003e is the defining feature of this objective, providing unprecedented clearance for industrial microscopy applications. This extended working distance enables examination of thick specimens or samples mounted in fixtures, rough or highly textured surfaces with significant topographical variation, tilted or angled specimens requiring oblique viewing, samples requiring manipulation or probing during observation, and specimens in environmental chambers or specialized holders. The generous clearance also provides \u003cb\u003eprotective margin\u003c\/b\u003e that reduces the risk of objective damage from accidental contact—a common concern in production environments where operators work quickly or examine irregularly shaped parts.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe objective supports both \u003cb\u003ebrightfield and darkfield illumination modes\u003c\/b\u003e, offering versatile imaging capabilities in a single lens. \u003cb\u003eBrightfield mode\u003c\/b\u003e provides conventional reflected light imaging ideal for examining polished surfaces, grain structure, and phase composition in metallographic samples. \u003cb\u003eDarkfield mode\u003c\/b\u003e enhances contrast for surface features, scratches, cracks, and topographical variations by illuminating the sample at oblique angles. This dual capability eliminates the need to switch objectives when changing illumination modes, improving workflow efficiency.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eLU Plan (Long-distance Universal Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge. This is essential for accurate measurement and documentation, as it eliminates the need to refocus when examining features at different positions in the field. The \u003cb\u003einfinity-corrected design\u003c\/b\u003e enables integration with tube lenses, beam splitters, camera systems, and other optical accessories without introducing aberrations.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eM32 thread mount\u003c\/b\u003e is compatible with Nikon industrial microscopes featuring BD (brightfield\/darkfield) nosepieces, including the Eclipse LV series and Epiphot series.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is in \u003cb\u003eexcellent, like-new pre-owned condition\u003c\/b\u003e, ready for demanding industrial inspection and materials analysis applications.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallographic analysis and quality control\u003c\/li\u003e\n\u003cli\u003eSemiconductor and electronics inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and characterization\u003c\/li\u003e\n\u003cli\u003eFailure analysis and root cause investigation\u003c\/li\u003e\n\u003cli\u003ePrecision machined part inspection\u003c\/li\u003e\n\u003cli\u003eMaterials science research\u003c\/li\u003e\n\u003cli\u003eForensic materials examination\u003c\/li\u003e\n\u003cli\u003eEducational and training laboratories\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUE60201\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e20×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.40\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e13mm (Extra-Long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eLU Plan ELWD (Long-distance Universal Plan, Extra-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Modes\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eBrightfield, Darkfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eM32 (Nikon BD nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCompatibility\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNikon industrial microscopes with BD nosepieces\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy of opaque materials\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eExcellent, Like-New\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695352906029,"sku":"MUE60201","price":1800.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE60201-2.gif?v=1765517908"},{"product_id":"nikon-lu-plan-elwd-50x-brightfield-darkfield-objective","title":"Nikon LU Plan ELWD 50x Brightfield Darkfield Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eHigh-resolution 50× industrial objective with exceptional 9.8mm working distance for brightfield and darkfield reflected light microscopy of opaque materials.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e50× Magnification, 0.55 NA\u003c\/b\u003e — Excellent resolving power for detailed surface inspection and microstructural analysis.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e9.8mm Extra-Long Working Distance\u003c\/b\u003e — Exceptional clearance accommodates thick, uneven, or mounted specimens while maintaining optical performance.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eBrightfield \u0026amp; Darkfield Capable\u003c\/b\u003e — Dual-mode illumination reveals both surface detail and topographical features in a single objective.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e — LU Plan design ensures compatibility with modern Nikon industrial microscope systems.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eExcellent Condition, As-New\u003c\/b\u003e — Pre-owned objective in excellent, as-new condition with pristine optical performance.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon LU Plan ELWD 50× Brightfield Darkfield Objective (MUE60501)\u003c\/b\u003e is a high-performance industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective combines \u003cb\u003emedium-high magnification with exceptional working distance and dual illumination modes\u003c\/b\u003e, providing outstanding versatility for demanding inspection and analysis applications.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e50× magnification and 0.55 numerical aperture\u003c\/b\u003e provide an optimal balance between \u003cb\u003efield of view and resolution\u003c\/b\u003e, making this objective ideal for examining microstructural features, grain boundaries, phase composition, and surface defects. This magnification range is particularly valuable for \u003cb\u003emetallographic analysis, semiconductor inspection, and quality control\u003c\/b\u003e applications where operators need to survey larger areas while maintaining the ability to resolve fine details.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e9.8mm extra-long working distance (ELWD)\u003c\/b\u003e is a standout feature of this objective—more than double the working distance of standard 50× objectives. This extended clearance provides significant advantages when examining thick specimens, samples mounted in fixtures, rough or highly textured surfaces, tilted or angled specimens, and samples requiring manipulation during observation. The generous clearance also provides \u003cb\u003eprotective margin\u003c\/b\u003e that reduces the risk of objective damage from accidental contact.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe objective supports both \u003cb\u003ebrightfield and darkfield illumination modes\u003c\/b\u003e, offering versatile imaging capabilities in a single lens. \u003cb\u003eBrightfield mode\u003c\/b\u003e provides conventional reflected light imaging ideal for examining polished surfaces, grain structure, and phase composition in metallographic samples. \u003cb\u003eDarkfield mode\u003c\/b\u003e enhances contrast for surface features, scratches, cracks, and topographical variations by illuminating the sample at oblique angles. This dual capability eliminates the need to switch objectives when changing illumination modes, improving workflow efficiency.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eLU Plan (Long-distance Universal Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge—essential for accurate measurement, documentation, and analysis. The \u003cb\u003einfinity-corrected design\u003c\/b\u003e enables integration with tube lenses, beam splitters, and camera systems without introducing optical aberrations.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eM32 thread mount\u003c\/b\u003e is compatible with Nikon industrial microscopes featuring BD (brightfield\/darkfield) nosepieces, including the Nikon Eclipse LV and Nikon Epiphot series.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is in \u003cb\u003eexcellent, as-new pre-owned condition\u003c\/b\u003e, ready for demanding industrial inspection and materials analysis applications.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallographic analysis and grain structure examination\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer and die inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and coating analysis\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and failure analysis\u003c\/li\u003e\n\u003cli\u003eMaterials science research and characterization\u003c\/li\u003e\n\u003cli\u003ePrecision machined surface evaluation\u003c\/li\u003e\n\u003cli\u003eEducational and training laboratories\u003c\/li\u003e\n\u003cli\u003eForensic materials examination\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUE60501\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e50×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.55\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e9.8mm (Extra-Long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eLU Plan ELWD (Long-distance Universal Plan, Extra-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Modes\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eBrightfield, Darkfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eM32 (Nikon BD nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy of opaque materials\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eExcellent, As-New\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"Spach Optics, Inc.","offers":[{"title":"Default Title","offer_id":51695354249517,"sku":"MUE60501","price":2100.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE60501-2.gif?v=1765517924"},{"product_id":"nikon-lu-plan-elwd-100x-brightfield-darkfield-objective","title":"Nikon LU Plan ELWD 100x Brightfield Darkfield Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eHigh-magnification 100× industrial objective with extra-long working distance for brightfield and darkfield reflected light microscopy of opaque materials.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e100× Magnification, 0.80 NA\u003c\/b\u003e — High-resolution imaging with excellent resolving power for detailed surface inspection and analysis.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e3.5mm Extra-Long Working Distance\u003c\/b\u003e — Extended clearance protects objective lens from contact with samples and accommodates varied surface topographies.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eBrightfield \u0026amp; Darkfield Capable\u003c\/b\u003e — Dual-mode illumination reveals both surface detail and topographical features in a single objective.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e — LU Plan design ensures compatibility with modern Nikon industrial microscope systems.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eNew\/Open Box Condition\u003c\/b\u003e — Factory-new objective with full optical performance and manufacturer specifications.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon LU Plan ELWD 100× Brightfield Darkfield Objective (MUE60901)\u003c\/b\u003e is a high-performance industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective combines \u003cb\u003ehigh magnification with extended working distance\u003c\/b\u003e, enabling detailed inspection of complex surface features while maintaining safe clearance between the objective and specimen.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e100× magnification and 0.80 numerical aperture\u003c\/b\u003e provide exceptional \u003cb\u003eresolving power and image detail\u003c\/b\u003e, revealing microstructural features, surface defects, and fine-scale topography that would be invisible at lower magnifications. The high NA ensures excellent \u003cb\u003elight-gathering capability and contrast\u003c\/b\u003e, critical for imaging low-reflectivity materials or subtle surface variations.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e3.5mm extra-long working distance (ELWD)\u003c\/b\u003e is a key advantage in industrial microscopy applications. Standard 100× objectives typically offer working distances of 1mm or less, making them vulnerable to contact damage when examining rough surfaces, tilted specimens, or samples with significant topographical variation. The extended working distance of this objective provides \u003cb\u003eprotective clearance\u003c\/b\u003e while maintaining high optical performance, reducing the risk of lens contamination or damage during routine inspection work.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe objective supports both \u003cb\u003ebrightfield and darkfield illumination modes\u003c\/b\u003e, offering versatile imaging capabilities in a single lens. \u003cb\u003eBrightfield mode\u003c\/b\u003e provides conventional reflected light imaging ideal for examining polished surfaces, grain structure, and phase composition in metallographic samples. \u003cb\u003eDarkfield mode\u003c\/b\u003e enhances contrast for surface features, scratches, cracks, and topographical variations by illuminating the sample at oblique angles, causing surface irregularities to scatter light into the objective while flat areas remain dark.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eLU Plan (Long-distance Universal Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge—essential for accurate measurement, documentation, and analysis. The \u003cb\u003einfinity-corrected design\u003c\/b\u003e enables integration with tube lenses, beam splitters, and camera systems without introducing optical aberrations.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eM32 thread mount\u003c\/b\u003e is compatible with Nikon industrial microscopes featuring BD (brightfield\/darkfield) nosepieces, including the Nikon Eclipse LV and Nikon Epiphot series.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is in \u003cb\u003enew\/open box condition\u003c\/b\u003e, ready for demanding industrial inspection and materials analysis applications.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallographic analysis and grain structure examination\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer and die inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and characterization\u003c\/li\u003e\n\u003cli\u003eFailure analysis and quality control\u003c\/li\u003e\n\u003cli\u003eCoating and thin film inspection\u003c\/li\u003e\n\u003cli\u003ePrecision machined surface evaluation\u003c\/li\u003e\n\u003cli\u003eMaterials science research\u003c\/li\u003e\n\u003cli\u003eForensic materials examination\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUE60901\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e100×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.80\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e3.5mm (Extra-Long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eLU Plan ELWD (Long-distance Universal Plan, Extra-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Modes\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eBrightfield, Darkfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eM32 (Nikon BD nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy of opaque materials\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNew\/Open Box\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695354708269,"sku":"MUE60901","price":3300.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE60901-2.gif?v=1765517940"},{"product_id":"nikon-tu-plan-elwd-100x-brightfield-darkfield-objective","title":"Nikon TU Plan ELWD 100X Brightfield Darkfield Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eHigh-magnification 100× industrial objective with 4.5mm working distance for brightfield and darkfield reflected light microscopy of opaque materials.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e100× Magnification, 0.80 NA\u003c\/b\u003e — High-resolution imaging with excellent resolving power for detailed surface inspection and analysis.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e4.5mm Extra-Long Working Distance\u003c\/b\u003e — Extended clearance protects objective lens and accommodates varied surface topographies.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eBrightfield \u0026amp; Darkfield Capable\u003c\/b\u003e — Dual-mode illumination reveals both surface detail and topographical features in a single objective.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e — TU Plan design ensures compatibility with modern Nikon industrial microscope systems.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eBrand New Condition\u003c\/b\u003e — Factory-new objective with full optical performance and manufacturer specifications.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon TU Plan ELWD 100× Brightfield Darkfield Objective (MUE61900)\u003c\/b\u003e is a premium industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective combines \u003cb\u003ehigh magnification with extended working distance and dual illumination modes\u003c\/b\u003e, providing exceptional versatility for demanding inspection and analysis applications.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e100× magnification and 0.80 numerical aperture\u003c\/b\u003e provide exceptional \u003cb\u003eresolving power and image detail\u003c\/b\u003e, revealing microstructural features, surface defects, and fine-scale topography invisible at lower magnifications. The high NA ensures excellent \u003cb\u003elight-gathering capability and contrast\u003c\/b\u003e, critical for imaging low-reflectivity materials or subtle surface variations.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e4.5mm extra-long working distance (ELWD)\u003c\/b\u003e is a key advantage in industrial microscopy applications. Standard 100× objectives typically offer working distances of 1mm or less, making them vulnerable to contact damage when examining rough surfaces, tilted specimens, or samples with significant topographical variation. The 4.5mm working distance provides \u003cb\u003eprotective clearance\u003c\/b\u003e while maintaining high optical performance, reducing the risk of lens contamination or damage during routine inspection work.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe objective supports both \u003cb\u003ebrightfield and darkfield illumination modes\u003c\/b\u003e, offering versatile imaging capabilities in a single lens. \u003cb\u003eBrightfield mode\u003c\/b\u003e provides conventional reflected light imaging ideal for examining polished surfaces, grain structure, and phase composition in metallographic samples. \u003cb\u003eDarkfield mode\u003c\/b\u003e enhances contrast for surface features, scratches, cracks, and topographical variations by illuminating the sample at oblique angles, causing surface irregularities to scatter light into the objective while flat areas remain dark. This dual capability eliminates the need to switch objectives when changing illumination modes, improving workflow efficiency and reducing the risk of sample or objective damage during objective changes.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eTU Plan (Transmitted\/Universal Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge—essential for accurate measurement, documentation, and analysis. The \u003cb\u003einfinity-corrected design\u003c\/b\u003e enables integration with tube lenses, beam splitters, and camera systems without introducing optical aberrations.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eM32 thread mount\u003c\/b\u003e is compatible with Nikon industrial microscopes featuring BD (brightfield\/darkfield) nosepieces, including the Nikon Eclipse LV and Nikon Epiphot series.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is \u003cb\u003ebrand new\u003c\/b\u003e, ready for demanding industrial inspection and materials analysis applications.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallographic analysis and grain structure examination\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer and die inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and characterization\u003c\/li\u003e\n\u003cli\u003eFailure analysis and quality control\u003c\/li\u003e\n\u003cli\u003eCoating and thin film inspection\u003c\/li\u003e\n\u003cli\u003ePrecision machined surface evaluation\u003c\/li\u003e\n\u003cli\u003eMaterials science research\u003c\/li\u003e\n\u003cli\u003eForensic materials examination\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUE61900\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e100×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.80\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e4.5mm (Extra-Long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eTU Plan ELWD (Transmitted\/Universal Plan, Extra-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Modes\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eBrightfield, Darkfield\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eM32 (Nikon BD nosepiece)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy of opaque materials\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNew\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695354773805,"sku":"MUE61900","price":9200.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUE61900-2.gif?v=1765517956"},{"product_id":"nikon-cf-plan-2-5x-epi-objective","title":"Nikon CF Plan 2.5x Reflected Light Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eLow-magnification 2.5× industrial objective with 8.8mm working distance for wide-field reflected light microscopy and specimen survey.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔍 \u003cb\u003e2.5× Magnification, 0.45 NA\u003c\/b\u003e — Wide field of view ideal for specimen survey, feature location, and low-magnification inspection.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e8.8mm Working Distance\u003c\/b\u003e — Generous clearance accommodates varied sample geometries and manipulation during observation.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eCF Plan Epi Design\u003c\/b\u003e — Flat-field correction with optimized contrast for reflected light microscopy of opaque materials.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e — CF (Crystal Focus) design ensures compatibility with Nikon infinity-corrected microscope systems.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eExcellent Condition\u003c\/b\u003e — Pre-owned objective in excellent working order with full optical performance.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon CF Plan 2.5× Epi Objective (MUL00030)\u003c\/b\u003e is a low-magnification industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective provides \u003cb\u003ewide-field viewing\u003c\/b\u003e essential for initial specimen survey, feature location, and low-magnification inspection work.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e2.5× magnification and 0.45 numerical aperture\u003c\/b\u003e deliver a \u003cb\u003elarge field of view\u003c\/b\u003e that enables operators to quickly survey specimens, locate features of interest, and assess overall sample condition before switching to higher magnifications for detailed examination. This magnification is particularly valuable in \u003cb\u003equality control environments\u003c\/b\u003e where operators need to rapidly scan parts for defects, in \u003cb\u003efailure analysis\u003c\/b\u003e where the location of damage must be identified before detailed investigation, and in \u003cb\u003emetallographic analysis\u003c\/b\u003e where overall microstructure must be assessed before examining specific features.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e8.8mm working distance\u003c\/b\u003e provides generous clearance for accommodating thick specimens, samples mounted in fixtures, or parts with irregular geometries. This extended working distance also enables \u003cb\u003emanipulation during observation\u003c\/b\u003e—operators can use probes, tools, or measurement devices while viewing the sample, making this objective valuable for interactive inspection and measurement tasks.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eCF Plan (Crystal Focus Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge. This is particularly important at low magnifications where the field of view is large—flat-field correction eliminates the need to refocus when examining features at different positions in the field, improving inspection efficiency and measurement accuracy.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eEpi (reflected light)\u003c\/b\u003e designation indicates optimization for \u003cb\u003ebrightfield reflected light microscopy\u003c\/b\u003e, with optical coatings and design elements that maximize contrast and image quality when examining opaque materials.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003einfinity-corrected optical design\u003c\/b\u003e enables integration with tube lenses, beam splitters, camera systems, and other optical accessories without introducing aberrations, providing flexibility for digital documentation and analysis workflows.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eRMS thread mount\u003c\/b\u003e is compatible with Nikon infinity-corrected industrial microscopes and other microscope systems accepting RMS-threaded objectives.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is in \u003cb\u003eexcellent pre-owned condition\u003c\/b\u003e, ready for demanding industrial inspection and materials analysis applications.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eInitial specimen survey and feature location\u003c\/li\u003e\n\u003cli\u003eQuality control and defect screening\u003c\/li\u003e\n\u003cli\u003eFailure analysis and damage assessment\u003c\/li\u003e\n\u003cli\u003eMetallographic overview and microstructure survey\u003c\/li\u003e\n\u003cli\u003eLarge-area inspection and documentation\u003c\/li\u003e\n\u003cli\u003eInteractive measurement and manipulation tasks\u003c\/li\u003e\n\u003cli\u003eEducational demonstrations and training\u003c\/li\u003e\n\u003cli\u003eLow-magnification photomicrography\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUL00030\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e2.5×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.45\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e8.8mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCF Plan Epi (Crystal Focus Plan, Epi)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Mode\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eEpi (reflected light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eField Correction\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003ePlan (flat-field)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eRMS (Royal Microscopical Society)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCompatibility\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNikon infinity-corrected microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWide-field reflected light microscopy, specimen survey\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eExcellent\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"Spach Optics, Inc.","offers":[{"title":"Default Title","offer_id":51695354904877,"sku":"MUL00030","price":795.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUL00030-2.jpg?v=1765517973"},{"product_id":"nikon-cf-plan-50x-epi-elwd-infinity-corrected-objective","title":"Nikon CF Plan 50x Epi ELWD Infinity Corrected Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eHigh-resolution 50× industrial objective with exceptional 8.7mm working distance for reflected light microscopy of opaque materials and metallurgical specimens.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e50× Magnification, 0.55 NA\u003c\/b\u003e — Excellent resolving power for detailed surface inspection and microstructural analysis.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e8.7mm Extra-Long Working Distance\u003c\/b\u003e — Exceptional clearance accommodates thick, uneven, or mounted specimens while maintaining optical performance.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eCF Plan Epi Design\u003c\/b\u003e — Flat-field correction with optimized contrast for reflected light microscopy of opaque materials.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e — CF (Crystal Focus) design ensures compatibility with Nikon infinity-corrected microscope systems.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eNew in Box Condition\u003c\/b\u003e — Factory-new objective with full optical performance and manufacturer specifications.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon CF Plan 50× Epi ELWD Objective (MUL03500)\u003c\/b\u003e is a high-performance industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective combines \u003cb\u003emedium-high magnification with exceptional working distance\u003c\/b\u003e, enabling detailed inspection of complex surface features while maintaining generous clearance between the objective and specimen.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e50× magnification and 0.55 numerical aperture\u003c\/b\u003e provide an optimal balance between \u003cb\u003efield of view and resolution\u003c\/b\u003e, making this objective ideal for examining microstructural features, grain boundaries, phase composition, and surface defects that require more detail than low-magnification objectives can provide, while offering a larger field of view than 100× objectives. This magnification range is particularly valuable for \u003cb\u003emetallographic analysis, semiconductor inspection, and quality control\u003c\/b\u003e applications where operators need to survey larger areas while maintaining the ability to resolve fine details.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e8.7mm extra-long working distance (ELWD)\u003c\/b\u003e is a standout feature of this objective—nearly double the working distance of standard 50× objectives. This extended clearance provides significant advantages when examining:\n\u003c\/p\u003e\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eThick specimens or samples mounted in fixtures\u003c\/li\u003e\n\u003cli\u003eRough or highly textured surfaces with significant topographical variation\u003c\/li\u003e\n\u003cli\u003eTilted or angled specimens requiring oblique viewing\u003c\/li\u003e\n\u003cli\u003eSamples requiring manipulation or probing during observation\u003c\/li\u003e\n\u003cli\u003eSpecimens in environmental chambers or specialized holders\u003c\/li\u003e\n\u003c\/ul\u003e\nThe generous clearance also provides \u003cb\u003eprotective margin\u003c\/b\u003e that reduces the risk of objective damage from accidental contact—a common concern in production environments where operators work quickly or examine irregularly shaped parts.\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eCF Plan (Crystal Focus Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge—essential for accurate measurement, documentation, and analysis. The \u003cb\u003eEpi (reflected light)\u003c\/b\u003e designation indicates optimization for \u003cb\u003ebrightfield reflected light microscopy\u003c\/b\u003e, with optical coatings and design elements that maximize contrast and image quality when examining opaque materials.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003einfinity-corrected optical design\u003c\/b\u003e enables integration with tube lenses, beam splitters, camera systems, and other optical accessories without introducing aberrations. This design provides flexibility for advanced imaging workflows including digital documentation, measurement, and analysis.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eRMS thread mount\u003c\/b\u003e is compatible with Nikon infinity-corrected industrial microscopes and other microscope systems accepting RMS-threaded objectives.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is \u003cb\u003ebrand new in box\u003c\/b\u003e, ready for demanding industrial inspection and materials analysis applications.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallographic analysis and grain structure examination\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer and die inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and coating analysis\u003c\/li\u003e\n\u003cli\u003eIndustrial quality control and failure analysis\u003c\/li\u003e\n\u003cli\u003eMaterials science research and characterization\u003c\/li\u003e\n\u003cli\u003ePrecision machined surface evaluation\u003c\/li\u003e\n\u003cli\u003eEducational and training laboratories\u003c\/li\u003e\n\u003cli\u003eForensic materials examination\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUL03500\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e50×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.55\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e8.7mm (Extra-Long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCF Plan Epi ELWD (Crystal Focus Plan, Epi, Extra-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Mode\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eEpi (reflected light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eField Correction\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003ePlan (flat-field)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eRMS (Royal Microscopical Society)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCompatibility\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNikon infinity-corrected microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy of opaque materials\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNew in Box\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695354937645,"sku":"MUL03500","price":1200.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUL03500-2.jpg?v=1765517988"},{"product_id":"nikon-cf-plan-epi-100x-slwd-objective","title":"Nikon CF Plan EPI 100x SLWD Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eHigh-magnification 100× industrial objective with super-long 4.7mm working distance for reflected light microscopy of opaque materials.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e🔬 \u003cb\u003e100× Magnification, 0.73 NA\u003c\/b\u003e — High-resolution imaging with excellent resolving power for detailed surface inspection and analysis.\u003c\/li\u003e\n\u003cli\u003e📏 \u003cb\u003e4.7mm Super-Long Working Distance\u003c\/b\u003e — Extended clearance protects objective lens and accommodates varied surface topographies.\u003c\/li\u003e\n\u003cli\u003e🌓 \u003cb\u003eCF Plan Epi Design\u003c\/b\u003e — Flat-field correction with optimized contrast for reflected light microscopy of opaque materials.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e — CF (Crystal Focus) design ensures compatibility with Nikon infinity-corrected microscope systems.\u003c\/li\u003e\n\u003cli\u003e📍 \u003cb\u003ePerfect Optics\u003c\/b\u003e — Flawless optical performance; minor cosmetic wear on exterior housing does not affect imaging quality.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon CF Plan Epi 100× SLWD Objective (MUL04900)\u003c\/b\u003e is a high-performance industrial objective designed for \u003cb\u003ereflected light microscopy of opaque materials\u003c\/b\u003e including metals, semiconductors, ceramics, and engineered surfaces. This objective combines \u003cb\u003ehigh magnification with super-long working distance\u003c\/b\u003e, enabling detailed inspection of complex surface features while maintaining protective clearance between the objective and specimen.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e100× magnification and 0.73 numerical aperture\u003c\/b\u003e provide exceptional \u003cb\u003eresolving power and image detail\u003c\/b\u003e, revealing microstructural features, surface defects, and fine-scale topography invisible at lower magnifications. The high NA ensures excellent \u003cb\u003elight-gathering capability and contrast\u003c\/b\u003e, critical for imaging low-reflectivity materials or subtle surface variations.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e4.7mm super-long working distance (SLWD)\u003c\/b\u003e is a defining feature of this objective. Standard 100× objectives typically offer working distances of 1mm or less, making them vulnerable to contact damage when examining rough surfaces, tilted specimens, or samples with significant topographical variation. The 4.7mm working distance—nearly five times longer than standard 100× objectives—provides \u003cb\u003eexceptional protective clearance\u003c\/b\u003e while maintaining high optical performance. This extended working distance is particularly valuable when examining:\n\u003c\/p\u003e\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eRough or textured surfaces with significant height variation\u003c\/li\u003e\n\u003cli\u003eTilted or angled specimens requiring oblique viewing\u003c\/li\u003e\n\u003cli\u003eSamples mounted in fixtures or holders\u003c\/li\u003e\n\u003cli\u003eSpecimens requiring manipulation or probing during observation\u003c\/li\u003e\n\u003cli\u003eMaterials prone to contaminating the objective front lens\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eCF Plan (Crystal Focus Plan)\u003c\/b\u003e optical design delivers \u003cb\u003eflat-field correction across the entire field of view\u003c\/b\u003e, ensuring sharp focus from center to edge—essential for accurate measurement, documentation, and analysis. The \u003cb\u003eEpi (reflected light)\u003c\/b\u003e designation indicates optimization for \u003cb\u003ebrightfield reflected light microscopy\u003c\/b\u003e, with optical coatings and design elements that maximize contrast and image quality when examining opaque materials.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003einfinity-corrected design\u003c\/b\u003e enables integration with tube lenses, beam splitters, and camera systems without introducing optical aberrations, providing flexibility for advanced imaging workflows including digital documentation, measurement, and analysis.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eRMS thread mount\u003c\/b\u003e is compatible with Nikon infinity-corrected industrial microscopes and other microscope systems accepting RMS-threaded objectives.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit features \u003cb\u003eperfect optics with flawless imaging performance\u003c\/b\u003e. The exterior housing shows minor cosmetic scratches (visible in product photos) that do not affect optical quality or functionality—a common characteristic of pre-owned industrial objectives that have seen professional use.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eMetallographic analysis and grain structure examination\u003c\/li\u003e\n\u003cli\u003eSemiconductor wafer and die inspection\u003c\/li\u003e\n\u003cli\u003eSurface defect detection and characterization\u003c\/li\u003e\n\u003cli\u003eFailure analysis and quality control\u003c\/li\u003e\n\u003cli\u003eCoating and thin film inspection\u003c\/li\u003e\n\u003cli\u003ePrecision machined surface evaluation\u003c\/li\u003e\n\u003cli\u003eMaterials science research\u003c\/li\u003e\n\u003cli\u003eForensic materials examination\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUL04900\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e100×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.73\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e4.7mm (Super-Long)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCF Plan Epi SLWD (Crystal Focus Plan, Epi, Super-Long Working Distance)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Mode\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eEpi (reflected light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCorrection\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInfinity-corrected\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eField Correction\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003ePlan (flat-field)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eRMS (Royal Microscopical Society)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCompatibility\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNikon infinity-corrected microscopes\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eReflected light microscopy of opaque materials\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003ePerfect optics; minor cosmetic wear on exterior housing\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695354970413,"sku":"MUL04900","price":1200.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/NIKON-MUL04900-2.jpg?v=1765518005"},{"product_id":"nikon-10x-cf-ic-epi-plan-di-mirau-interferometry-objective","title":"Nikon 10x CF IC Epi Plan DI Mirau Interferometry Objective","description":"\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003ePrecision 10× Mirau interferometry objective for non-contact optical profilometry and surface topography measurement with sub-wavelength vertical resolution.\u003c\/b\u003e\u003c\/p\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003e📏 \u003cb\u003eMirau Interferometry Design\u003c\/b\u003e — Integrated reference surface enables non-contact surface measurement with nanometer-scale vertical resolution.\u003c\/li\u003e\n\u003cli\u003e🔬 \u003cb\u003e10× Magnification, 0.30 NA\u003c\/b\u003e — Optimized for medium-magnification surface profiling with excellent lateral resolution and field of view.\u003c\/li\u003e\n\u003cli\u003e📐 \u003cb\u003e7.4mm Working Distance\u003c\/b\u003e — Generous clearance accommodates varied sample geometries and measurement configurations.\u003c\/li\u003e\n\u003cli\u003e∞ \u003cb\u003eInfinity-Corrected Optics\u003c\/b\u003e — CF IC (Crystal Focus Infinity Corrected) design ensures compatibility with modern Nikon microscope systems.\u003c\/li\u003e\n\u003cli\u003e✨ \u003cb\u003eBrand New Condition\u003c\/b\u003e — Factory-new objective with full manufacturer specifications and optical performance.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔧 Product Description\u003c\/h2\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eNikon 10× CF IC Epi Plan DI Mirau Interferometry Objective (MUL40101)\u003c\/b\u003e is a specialized optical component designed for \u003cb\u003enon-contact optical profilometry and surface topography measurement\u003c\/b\u003e. This objective incorporates a \u003cb\u003eMirau interferometer configuration\u003c\/b\u003e, enabling precise three-dimensional surface mapping with \u003cb\u003evertical resolution to within a fraction of the wavelength of light\u003c\/b\u003e — typically achieving sub-nanometer measurement precision.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eIn the Mirau interferometry design, a \u003cb\u003esemi-transparent reference mirror is integrated within the objective\u003c\/b\u003e itself, positioned between the objective lens and the sample. Incident light is split into two beams: one reflects from the reference surface within the objective, while the other reflects from the sample surface. When these beams recombine, they create an \u003cb\u003einterference pattern (interferogram)\u003c\/b\u003e that encodes the height variations of the sample surface. Advanced software analyzes this interference pattern to generate precise \u003cb\u003e3D surface maps, roughness parameters, and dimensional measurements\u003c\/b\u003e.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003e10× magnification and 0.30 numerical aperture\u003c\/b\u003e provide an optimal balance between \u003cb\u003efield of view and lateral resolution\u003c\/b\u003e, making this objective ideal for measuring features ranging from micrometers to millimeters in lateral extent. The \u003cb\u003e7.4mm working distance\u003c\/b\u003e offers excellent clearance for accommodating samples with varied topography, tilted surfaces, or measurement fixtures, while maintaining the precision required for interferometric measurement.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThe \u003cb\u003eCF IC (Crystal Focus Infinity Corrected)\u003c\/b\u003e optical design ensures compatibility with Nikon's infinity-corrected microscope systems, enabling integration with tube lenses, beam splitters, and camera systems for advanced measurement workflows. The \u003cb\u003eEpi Plan DI\u003c\/b\u003e designation indicates optimized performance for \u003cb\u003ereflected light (epi-illumination) applications\u003c\/b\u003e with differential interference capabilities.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis objective is essential for applications requiring \u003cb\u003enon-contact, non-destructive surface measurement\u003c\/b\u003e where mechanical profilometry would damage delicate surfaces or where sub-micrometer vertical resolution is required. The interferometric approach provides \u003cb\u003etrue 3D data\u003c\/b\u003e rather than simple 2D imaging, enabling quantitative analysis of surface roughness, step heights, flatness, and complex topographical features.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003eThis unit is \u003cb\u003ebrand new\u003c\/b\u003e, ready for integration into precision metrology and surface characterization systems.\u003c\/p\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e🔎 Typical Applications\u003c\/h2\u003e\n\n\u003cul style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\n\u003cli\u003eSemiconductor wafer surface characterization\u003c\/li\u003e\n\u003cli\u003eMEMS and microelectronics surface profiling\u003c\/li\u003e\n\u003cli\u003eOptical component surface quality inspection\u003c\/li\u003e\n\u003cli\u003eThin film thickness measurement\u003c\/li\u003e\n\u003cli\u003eSurface roughness analysis (Ra, Rq, Rz parameters)\u003c\/li\u003e\n\u003cli\u003eStep height and trench depth measurement\u003c\/li\u003e\n\u003cli\u003ePrecision machined surface inspection\u003c\/li\u003e\n\u003cli\u003eMaterials science and tribology research\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003chr\u003e\n\n\u003ch2 style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e📊 Key Specifications\u003c\/h2\u003e\n\n\u003ctable style=\"font-family: 'Segoe UI Emoji', sans-serif; border-collapse: collapse; width: 100%;\"\u003e\n\u003ctr\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eSpecification\u003c\/b\u003e\u003c\/th\u003e\n\u003cth style=\"border: 1px solid #ddd; padding: 8px; text-align: left; background-color: #f2f2f2;\"\u003e\u003cb\u003eDetails\u003c\/b\u003e\u003c\/th\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCatalog Number\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMUL40101\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMagnification\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e10×\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNumerical Aperture (NA)\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e0.30\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eWorking Distance\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003e7.4mm\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eOptical Design\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCF IC (Crystal Focus Infinity Corrected)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eInterferometry Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eMirau (integrated reference surface)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eIllumination Mode\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eEpi (reflected light)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eThread Type\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eRMS (Royal Microscopical Society)\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eApplication\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNon-contact optical profilometry, surface topography measurement\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eCondition\u003c\/td\u003e\n\u003ctd style=\"border: 1px solid #ddd; padding: 8px;\"\u003eNew\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\n\u003chr\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003cb\u003eUniversity purchase orders accepted.\u003c\/b\u003e Contact us for volume pricing and institutional procurement options.\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\" style=\"font-family: 'Segoe UI Emoji', sans-serif;\"\u003e\u003ci\u003eNote: This item is currently out of stock. Please contact us for availability and lead time information.\u003c\/i\u003e\u003c\/p\u003e","brand":"spachoptics","offers":[{"title":"Default Title","offer_id":51695355101485,"sku":"MUL40101","price":3600.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0933\/7965\/8029\/files\/10XDI.jpg?v=1777382318"}],"url":"https:\/\/www.spachoptics.com\/collections\/industrial-infinity-corrected.oembed","provider":"Spach Optics, Inc.","version":"1.0","type":"link"}